ADC Testing via Bit Transition Frequency Analysis

Solution Overview

Problem

Conventional testing apparatuses for analog-to-digital converters have high manufacturing costs and complex circuit designs due to the need for large memory spaces and intricate calculations, making them costly and resource-intensive.

Innovation Solution

A testing apparatus comprising frequency counters and a comparison module that calculates and compares transition frequencies of bit signals to estimate performance values, eliminating the need for large memory storage and simplifying circuit design.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a conventional testing apparatus uses a histogram generator with large memory space and complex calculation circuits, then the performance evaluation accuracy of the analog-to-digital converter is improved, but the hardware cost and device complexity increase significantly

Engineering Contradiction:

Improveperformance evaluation accuracyVSAvoidcircuit complexity

Core Design Contradiction:

Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts only the essential measurement information (transition frequencies of bit signals) from the complex histogram generation process, eliminating the need for large memory spaces and complex calculation circuits while maintaining measurement accuracy

Inventive Principle:

Principle #2Taking out (Extraction)

Solution Approach 2:

The patent replaces the mechanical/computational system of histogram generation and complex calculations with a frequency counting system that uses frequency counters to directly measure transition frequencies, simplifying the overall system architecture

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

2Measurement precision

If a conventional testing apparatus uses a histogram generator with large memory space, then the performance evaluation accuracy of the analog-to-digital converter is improved, but the manufacturing cost increases

Engineering Contradiction:

Improveperformance evaluation accuracyVSAvoidmanufacturing cost

Core Design Contradiction:

Measurement precisionVSEase of manufacture

Solution Approach 1:

The patent extracts only the essential measurement information (transition frequencies of bit signals) from the complex histogram generation process, eliminating the need for large memory spaces and complex calculation circuits while maintaining measurement accuracy

Inventive Principle:

Principle #2Taking out (Extraction)

Solution Approach 2:

The patent uses frequency counters which are simpler and cheaper components compared to large memory spaces and complex calculation circuits, reducing the manufacturing cost while maintaining the essential measurement functionality

Inventive Principle:

Principle #27Cheap short-living objects (Disposable)

3Measurement precision

If a conventional testing apparatus uses complex calculation circuits for histogram generation, then the performance evaluation accuracy of the analog-to-digital converter is improved, but the hardware cost increases

Engineering Contradiction:

Improveperformance evaluation accuracyVSAvoidhardware cost

Core Design Contradiction:

Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces the mechanical/computational system of histogram generation and complex calculations with a frequency counting system that uses frequency counters to directly measure transition frequencies, simplifying the overall system architecture

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent extracts only the essential measurement information (transition frequencies of bit signals) from the complex histogram generation process, eliminating the need for large memory spaces and complex calculation circuits while maintaining measurement accuracy

Inventive Principle:

Principle #2Taking out (Extraction)

Data Source

PatentUS8648740B2Testing apparatus and method for testing analog-to-digital converter

Publication Date: 2014.02.11 SILICON MOTION INC

AI summary

The invention provides a testing apparatus. In one embodiment, the testing apparatus receives a plurality of bit signals output by an analog-to-digital converter, and comprises a plurality of frequency counters and a comparison module. The frequency counters respectively calculate a plurality of transition frequencies of the values of the bit signals. The comparison module respectively compares the transition frequencies with a plurality of ideal transition frequencies to obtain a plurality of error frequencies. The performance analysis module estimates a performance value of the analog-to-digital converter according to the error frequencies.