Additive Manufacturing Test Structure for Beam Scanner Alignment
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Solution Overview
Problem
Conventional methods for aligning multiple beam scanners in additive manufacturing systems are inefficient, requiring external equipment and causing delays due to the need for multiple measurements and transportation of test articles, which consumes staff time and increases production delays.
Innovation Solution
A test structure with calibration features is used within the additive manufacturing system, allowing for the calculation and adjustment of beam scanner alignment without external equipment, enabling simultaneous alignment along multiple axes in a single build cycle.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional test articles are used for beam scanner alignment, then alignment can be performed, but external equipment and multiple measurements are required causing production delays and consuming staff time
Solution Approach 1:
The patent introduces an intermediary test structure with specific calibration features (circular patterns with known geometries) that mediates between the beam scanners and the alignment measurement process. This intermediary structure enables direct measurement within the build chamber using the build platform's own imaging system, eliminating the need for external equipment and multiple transportation steps while maintaining alignment precision.
2Measurement precision
If conventional test articles are transported to external equipment for inspection, then alignment measurement can be performed, but staff time increases and production delays occur
Solution Approach 1:
The test structure is designed to be self-measuring within the additive manufacturing system itself. The calibration features are configured such that the build platform's imaging system can directly capture and measure their positions and orientations without requiring removal from the build chamber or use of external measurement equipment, enabling the system to perform its own alignment verification and significantly improving productivity.
3Reliability
If multiple measurements and external equipment are used for alignment, then comprehensive alignment data can be obtained, but the process complexity and time consumption increase
Solution Approach 1:
The test structure serves multiple functions simultaneously: it provides calibration features for alignment measurement, acts as a reference standard with known geometries, and can be measured using the build platform's existing imaging system. This multi-functionality eliminates the need for separate measurement equipment and procedures, reducing process complexity while maintaining comprehensive alignment verification capability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for precise alignment of beam scanners within the additive manufacturing system, reducing production delays and staff time by enabling real-time adjustment and alignment without the need for external equipment, thus improving operational efficiency.
Implementation Method 1
The melting or sintering may be performed by, for example, a high powered scanning beam, such as a 100 Watt ytterbium laser, to sinter or fully weld (melt) the metal powder to form a solid object
Implementation Method 2
The scanning beam moves in the X and Y directions using scanning mirrors
Data Source
AI summary
Embodiments of the disclosure provide a test structure for additive manufacture and related methods for emitter alignment. A test structure according to the disclosure can include: a body having a reference surface, wherein the body is formed with a first beam scanner of the AM system; and a plurality of calibration features defined on the reference surface of the body, wherein each of the plurality of calibration features includes an alignment surface positioned at an offset distance relative to the reference surface, and wherein each of the plurality of calibration features is formed with a second beam scanner of the AM system different than the first beam scanner.