Address Range Comparator for Multi-Size Memory Access Detection

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Solution Overview

Problem

Highly integrated digital signal processing systems face challenges in testability, observability, and controllability due to denser designs and increasing clock rates, leading to reduced visibility and control, longer design cycles, and increased costs, with traditional debug methods becoming inadequate for complex systems-on-a-chip.

Innovation Solution

The implementation of on-chip debug facilities with a scalable, two-tiered approach, including real-time emulation and advanced analysis capabilities, along with a comparator for processor memory access, to enhance visibility and control, and the use of a debugger application program to allocate debug resources dynamically.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of information

If traditional debug methods are used for complex systems-on-a-chip, then simplicity and low cost are maintained, but visibility and control over system activity are reduced

Engineering Contradiction:
Improvevisibility and controlVSAvoiddebug facility complexity
Core Design Contradiction:
Loss of informationVSDevice complexity

Solution Approach 1:

The debug facility is implemented as an on-chip nested structure where the comparator unit is integrated within the existing memory access logic. The comparator compares processor memory access addresses against predetermined reference addresses using nested comparison logic that fits within the chip's existing architecture, providing debug capabilities without requiring a completely separate external debug system.

Inventive Principle:
Principle #7Nested doll (Nesting)

Solution Approach 2:

The comparator acts as an intermediary component between the processor memory access logic and the debug output. It intercepts memory access addresses, performs comparison operations against reference addresses, and generates match signals that indicate when processor memory accesses match the reference addresses, thereby providing visibility into memory access patterns without disrupting normal processor operation.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of operation

If on-chip debug facilities are implemented to improve visibility and control, then debug capability is enhanced, but device complexity and manufacturing cost increase

Engineering Contradiction:
Improvedebug capabilityVSAvoidmanufacturing cost
Core Design Contradiction:
Ease of operationVSEase of manufacture

Solution Approach 1:

The debug facility is segmented into modular components: address comparison units, reference address storage registers, and match signal generation logic. Each segment can be independently configured and implemented, allowing the debug capability to be added in a modular fashion that minimizes impact on the overall manufacturing process and cost structure.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The comparator unit operates autonomously within the on-chip debug facility, automatically comparing processor memory access addresses against stored reference addresses and generating match signals without requiring external intervention. This self-service operation reduces the need for additional external debug equipment and simplifies the manufacturing integration process.

Inventive Principle:
Principle #25Self-service

3Measurement precision

If multiple comparators are used to detect different memory access types, then detection accuracy is improved, but device complexity increases

Engineering Contradiction:
Improvedetection accuracyVSAvoidcomparator quantity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The comparator unit is designed with multi-functionality to handle different memory access types (read, write, read-modify-write) using a single comparison mechanism. The comparator can be configured through control signals to perform different comparison operations and can detect multiple memory access types without requiring separate dedicated comparators for each access type, thereby maintaining detection accuracy while reducing overall device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The comparator facility employs dynamic configuration capabilities where the comparison logic can be programmatically adjusted to detect different memory access patterns. Control registers allow the comparator to dynamically change its comparison criteria and reference addresses, enabling a single comparator unit to adaptively detect multiple types of memory accesses that would otherwise require multiple static comparators.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS8655637B2Address range comparator for detection of multi-size memory accesses with data matching qualification and full or partial overlap
Publication Date: 2014.02.18 TEXAS INSTRUMENTS INC
  • US8655637B2 patent drawing
  • US8655637B2 patent drawing
  • US8655637B2 patent drawing

AI summary

An memory access address comparator includes two comparators comparing an input memory access address with respective reference addresses. The comparators produce a match indication on selectable criteria, such as address size, full or partial overlap, greater than, less than, equal to, not equal to, less than or equal to, and greater than or equal to, and can be selectively chained. Input multiplexers permit memory access address bus selection. The comparator output may be selectively dependent upon corresponding data matches. The reference addresses, comparison data and control functions are enabled via central processing unit accessible memory mapped registers.