Adjustable Attenuation Circuit for Adaptive BIST Signal Testing
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Solution Overview
Problem
Current high-speed ATE test environments struggle to adapt to varying attenuation requirements, necessitating repeated testing and consuming significant time due to their fixed and precise design.
Innovation Solution
An adjustable attenuation test system that utilizes a variable impedance circuit path, adjusting resistance values to meet diverse testing needs through a control circuit and MEMS switches, allowing for reliable electrical testing environments.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a fixed and precise design is used in the ATE test environment, then the electrical environment is reliable, but it cannot adapt to different attenuation requirements and requires repeated testing
Solution Approach 1:
The patent applies the dynamics principle by replacing fixed resistors with adjustable attenuation circuits that can dynamically change their resistance values. The attenuation circuit includes multiple resistors that can be selectively connected or disconnected through control signals, allowing the electrical environment to adapt to different attenuation requirements while maintaining reliability through controlled adjustment.
Solution Approach 2:
The patent implements parameter changes by modifying the resistance values in the attenuation circuit based on different testing requirements. The control circuit adjusts the attenuation parameter dynamically by changing which resistors are active in the circuit path, enabling the system to handle various attenuation levels (e.g., different USB specifications) without repeated testing.
2Device complexity
If a fixed attenuation circuit is used, then the circuit design is simple, but it requires repeated testing to determine correctness for different devices
Solution Approach 1:
The patent uses dynamics to enable the attenuation circuit to change its characteristics during operation. By incorporating adjustable resistors that can be switched based on device requirements, the system avoids repeated testing while maintaining a relatively simple overall circuit structure that can adapt to different scenarios.
Solution Approach 2:
The patent implements feedback through a lookback mechanism where the system tests with initial attenuation settings, evaluates the results, and automatically adjusts the attenuation circuit parameters for subsequent tests. This feedback loop eliminates the need for manual repeated testing by automatically optimizing the electrical environment based on previous test outcomes.
3Adaptability or versatility
If the resistance value is adjusted to meet different attenuation requirements, then adaptability is improved, but the circuit complexity increases
Solution Approach 1:
The patent applies segmentation by dividing the attenuation circuit into multiple discrete resistor elements that can be independently controlled. Each resistor can be switched on or off based on the required attenuation level, allowing the system to achieve multiple attenuation settings while keeping each individual circuit element relatively simple and manageable.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system provides adaptable electrical testing by adjusting impedance to match different devices' attenuation requirements, reducing testing time and minimizing parasitic capacitance interference.
Implementation Method 1
adjusting an attenuation capability by changing a resistance value of a circuit path
Data Source
AI summary
An adjustable attenuation test system and an operation method thereof are provided. The attenuation test system includes: an adjustable attenuation circuit, a control circuit, and a device under test. The device under test is connected to the adjustable attenuation circuit and the control circuit. The device under test includes a transmitting end and a receiving end. The adjustable attenuation circuit has a variable impedance. When the device under test performs a built-in self-test (BIST), the device under test outputs a test pattern data from the transmitting end. The device under test generates a determining result based on the test pattern received by the receiving end. The control circuit receives the determining result, and generates and outputs an attenuation control signal to the adjustable attenuation circuit based on the determining result. The adjustable attenuation adjusts the variable impedance based on the attenuation control signal.