Adjustable Base for Contour Measuring Probe Alignment
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Solution Overview
Problem
The existing contour measuring probes face a precision issue due to the inability of their tip extensions to accurately reflect height changes along the Z-axis, as they are slanted relative to the axis and cannot extend properly due to limitations in the machining precision of guide rails, leading to decreased measuring precision.
Innovation Solution
A base system incorporating adjustable U-shaped elements and spacers allows for the contour measuring probe to be adjusted and tilted, ensuring the tip extension can be aligned parallel to the Z-axis, enabling precise height measurements by using air bearings to minimize friction and facilitate smooth movement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If the contour measuring probe is fixed to the slidable platform with conventional guide rails, then the probe can move along the platform, but the tip extension becomes slanted relative to the Z-axis due to machining precision limitations, causing decreased measuring precision
Solution Approach 1:
The patent replaces the conventional fixed guide rail system with an adjustable base structure comprising multiple spaced plates and connecting elements with adjustable spacers. This dynamic structure allows the tip extension to be precisely aligned parallel to the Z-axis, eliminating the slanting problem caused by machining precision limitations while maintaining probe movement capability.
Solution Approach 2:
The patent introduces adjustable spacers that can modify the distance between spaced plates, enabling precise adjustment of the tip extension's angular orientation. By changing the geometric parameters of the base structure, the system achieves accurate alignment of the tip extension with the Z-axis, thereby improving measurement precision without sacrificing operational ease.
2Ease of manufacture
If the tip extension is slanted relative to the Z-axis, then the probe can be easily mounted on the platform, but the displacement information cannot accurately reflect height changes, leading to reduced measurement precision
Solution Approach 1:
The patent implements a preliminary alignment mechanism through the adjustable base structure with spacers. Before actual measurement, the tip extension is pre-aligned parallel to the Z-axis using the adjustable spacers, ensuring that displacement information will accurately reflect height changes. This preliminary action prevents the measurement precision problem from occurring in the first place.
Solution Approach 2:
The patent replaces the conventional mechanical mounting system that relies on fixed guide rails with an adjustable mechanical structure comprising spaced plates and connecting elements. This substitution allows for precise angular adjustment of the tip extension, ensuring it remains parallel to the Z-axis while maintaining ease of mounting through the modular design.
Data Source
AI summary
An exemplary base includes a first elastic element, a second elastic, two first adjustable spacers and two second adjustable spacers. The first elastic element includes two first spaced plates and a first connecting element for connecting the two first spaced plates. The second elastic element includes two second spaced plates and a second connecting element for connecting the two second spaced plates. The first connecting element and the second connecting element are not in a plane. Two first adjustable spacers connect the two first spaced plates and adjust a distance between the two first spaced plates. Two second adjustable spacers connect the two second spaced plates and adjust a distance between the two second spaced plates.