Adjustable Dot Pattern Scanning for Microscopy Speed and Resolution
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Solution Overview
Problem
Current scanning methods face limitations in increasing scanning speed due to device speed constraints and signal-to-noise ratio degradation at higher speeds, and struggle with optimal dot pattern generation that balances illumination point distance and axial resolution, leading to image artifacts and technical limitations in microscopy.
Innovation Solution
A method and device for scanning a sample using an adjustable dot pattern with a variable number of illumination points, where the dot pattern is moved in equal grid steps or at a constant speed, allowing flexible generation and optimization of the dot pattern to balance illumination point distance and axial resolution, thereby enhancing scanning efficiency and image quality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the scanning speed is increased, then the productivity is improved, but the signal-to-noise ratio deteriorates
Solution Approach 1:
The illumination beam is divided into multiple illumination points (e.g., 2, 3, or more points) that scan the sample simultaneously. This parallelization allows the scanning speed to be effectively increased while maintaining sufficient dwell time at each point, thereby preserving the signal-to-noise ratio. The segmentation of the beam enables multiple locations to be illuminated and detected in parallel, resolving the contradiction between speed and signal quality.
2Area of stationary object
If the distance between illumination points is increased, then the area coverage is improved, but the axial resolution deteriorates
Solution Approach 1:
The system dynamically adjusts the distance between illumination points based on the specific imaging requirements. The spacing can be modified during operation to optimize for either broader area coverage or higher axial resolution depending on the experimental conditions. This dynamic adaptability allows the system to resolve the contradiction by tuning the parameter to match the current imaging needs.
3Area of stationary object
If the dot pattern size is increased, then the scanning area is improved, but the device complexity increases
Solution Approach 1:
The optical components are designed to be multi-functional, serving both to generate the dot pattern and to scan the sample area. By integrating multiple functions into compact optical elements, the system achieves large scanning areas without proportionally increasing component size or complexity. The same optical train that creates the multi-point pattern also performs the scanning motion, eliminating the need for separate large-scale components.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables flexible and optimal dot pattern generation for improved scanning speed and resolution, reducing image artifacts and accommodating various detection units, while maintaining high signal quality and precision.
Implementation Method 1
US Pat. No. 7,724,426 B2 discloses a method for scanning a sample in which the illuminating light beam used for scanning is split into multiple illumination points by an AOD to parallelize the scanning process
Implementation Method 2
This is achieved by a method for scanning a sample, in which at least two illumination points are generated to form a dot pattern
Data Source
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AI summary
The invention relates to a method for scanning a sample (100) in which at least two illumination points (12) are generated to form a point pattern (10). The point pattern (10) has an adjustable number of illumination points (12). At least one freely selectable parameter for defining the point pattern (10) is preset or is adjusted. The point pattern (10) defined by the freely selectable parameter, in order to scan at least one predetermined region (40) of the sample (10), is moved in a first direction to generate scan lines (14) associated with the illumination points (12) of the point pattern (10) and in a second direction to generate scan lines (14) following the scan lines (14), wherein the point pattern is moved in the second direction in identical scan steps or at a constant speed. The illumination points (12) of the point pattern (10) are arranged on a line in the second direction.