Adjustable Measurement Device for High Frequency Waveforms
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Solution Overview
Problem
Existing measurement devices for high frequency waveforms or ripple voltage, such as high voltage active probes, are expensive and inconvenient to use, while passive probes require tedious wire soldering processes.
Innovation Solution
An adjustable measurement device with a C-shape case, guide rail, and sliding contact portions allows for adjustable distance between positive and negative contact points, enabling efficient connection to test points without soldering, using insulating materials for ease of use and preventing electrical misconnection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If high voltage active probes are used, then measurement precision and waveform accuracy are improved, but device cost increases significantly
Solution Approach 1:
The patent introduces an intermediary adapter device that connects between the oscilloscope probe and the device under test. This adapter provides the necessary high voltage tolerance and measurement capabilities without requiring expensive active probes, thereby reducing device cost while maintaining measurement precision through the intermediary component's specialized design
2Ease of manufacture
If passive probes are used, then device cost is reduced, but ease of operation deteriorates due to tedious wire soldering requirements
Solution Approach 1:
The adapter device is segmented into distinct functional components: a probe connection interface, an adjustable contact mechanism, and a test point interface. This segmentation allows each component to perform its specific function independently, with the adjustable contact mechanism eliminating the need for soldering by providing a simple mechanical connection interface that can be quickly attached and detached
Solution Approach 2:
The adapter incorporates an adjustable contact portion that can be dynamically positioned along the test point to accommodate different probe lengths and configurations. This dynamic adjustability simplifies operation by allowing users to quickly adapt the connection without performing tedious soldering tasks, while maintaining cost-effectiveness through the passive probe design
3Device complexity
If fixed distance contact points are used, then device structure is simplified, but adaptability deteriorates for different test point distances
Solution Approach 1:
The adapter features a movable adjustable contact portion that can be positioned along the test point to match different probe lengths and test point configurations. This dynamic adjustment capability maintains structure simplicity while providing versatility, as the same basic adapter structure can accommodate various test scenarios through the movable contact mechanism
Data Source
AI summary
An adjustable measurement device includes a case, a positive contact portion, a negative contact portion, a test probe, a first wire, and a second wire. The positive contact portion is positioned on an end of the case and electrically connected to the first wire. The negative contact portion is movably received in the case and electrically connected to the second wire. A receiving hole is defined in the negative contact portion for the test probe. The test probe includes a main body electrically connected to the negative contact portion, a tip portion electrically connected to the positive contact portion, and an insulating portion positioned between the main body and the tip portion. A distance between the positive contact portion and the negative contact portion is adjustable by moving the negative contact portion. The negative contact portion and the positive contact portion are isolated from each other.