Adjustable Opener Pin Blocks for Semiconductor Test Handlers
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Solution Overview
Problem
Conventional test handlers require replacement of the opener and carrier boards when semiconductor device dimensions change, leading to increased replacement costs and resource wastage due to fixed intervals between opening pins.
Innovation Solution
An adjustable opener with movable pin blocks and interval retaining apparatuses, including elastic members and position determining mechanisms, allows for adaptation to various carrier boards without needing replacement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If the interval between opening pins is fixed, then the opener structure is simple, but it cannot adapt to different semiconductor device dimensions
Solution Approach 1:
The opener employs movable pin blocks that can shift position along the opening plate, transforming the fixed interval structure into a dynamic one. The pin blocks are guided by guide rods and positioned by elastic members, allowing the interval between opening pins to be adjusted according to different semiconductor device dimensions while maintaining operational reliability
Solution Approach 2:
The opener divides the pin structure into separate pin blocks that can be independently positioned. Each pin block contains opening pins and can move relative to the opening plate, enabling flexible adjustment of pin intervals. This segmentation allows the system to adapt to different device sizes without requiring complete opener replacement
2Reliability
If the opener is replaced for each carrier board type, then the opening function is reliable, but resource waste and replacement costs increase
Solution Approach 1:
The opener is designed as a universal device that can serve multiple carrier board types through adjustable pin blocks. By allowing position adjustment of pin blocks along the opening plate, a single opener structure can accommodate different semiconductor device dimensions and carrier board configurations, eliminating the need for multiple specialized openers and reducing resource waste
3Adaptability or versatility
If the opening pins are spaced at fixed intervals, then the opener manufacturing is simple, but it cannot accommodate altered semiconductor device dimensions
Solution Approach 1:
The manufacturing process incorporates movable pin blocks guided by guide rods and positioned by elastic members, allowing post-manufacturing adjustment of pin intervals. This dynamic design maintains manufacturing simplicity while enabling adaptation to different device dimensions through mechanical adjustment rather than custom manufacturing for each variant
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the opener to adjust pin intervals according to changing semiconductor device sizes, reducing resource waste and replacement costs, and allowing continued use without altering the opener or buffer table.
Implementation Method 1
the interval retaining element includes at least one or more elastic members for applying an elastic force to at least one of the pin blocks forming a pair
Data Source
AI summary
An opener and a buffer table for a test handler are disclosed. The opener includes an opening plate, a plurality of pin blocks forming pairs, and at least one or more interval retaining apparatus for retaining an interval between the pin blocks forming a pair. Each of the pin blocks is movably coupled to the opening plate, and includes opening pins for releasing a holding state of a holding apparatus that holds semiconductor devices in a carrier board. Although semiconductor devices to be tested are altered in size and a carrier board loading with the semiconductor devices is thus replaced, the opener does not need to be replaced, thereby reducing the replacement cost and the waste of resources.