Adjustable Probe With Flexible Linkage for Dense PCB Test Points
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Solution Overview
Problem
Test and measurement probes face challenges in accessing small, densely packed, and variably oriented test points on device-under-test (DUT) circuit boards, particularly with differential signaling, where traditional solder-down probes are cumbersome, time-consuming, and prone to signal fidelity issues and wear.
Innovation Solution
A probe with an adjustable test point contact system, featuring a body, a rigid member, a flexible arm, and a flexible linkage that allows for linear travel and bending to accommodate varying test point spacings, enabling precise and flexible electrical contact with DUT test points, and optionally includes a light source for improved accessibility.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a solder-down probe is used to achieve reliable electrical contact with DUT test points, then connection reliability is improved, but setup time increases and operation complexity increases due to soldering requirements
Solution Approach 1:
The patent replaces the soldering process (thermal/chemical mechanical system) with a purely mechanical pressing action. The probe tip is pressed directly onto the test point contact, establishing electrical connection through mechanical force alone, eliminating the need for soldering iron, flux, and heating processes.
Solution Approach 2:
The probe tip is designed as a disposable component that can be easily replaced. After use or when worn, the entire probe tip assembly is discarded and replaced with a new one, eliminating the complex process of unsoldering and resoldering wires. This single-use design simplifies the operation while maintaining connection reliability during the probe's service life.
2Reliability
If a solder-down probe is used to achieve reliable electrical contact, then connection stability is improved, but ease of operation deteriorates due to skill requirements and dexterity needs
Solution Approach 1:
The patent replaces the complex soldering operation (requiring thermal control, positioning skill, and dexterity) with a simple mechanical pressing action. The user only needs to press the probe tip onto the test point contact, which can be done with minimal skill and training, greatly improving ease of operation while maintaining connection stability.
Solution Approach 2:
The probe tip design incorporates self-aligning features and a structure that naturally guides the pressing action onto the test point contact. The mechanical design itself facilitates proper positioning and connection, reducing the skill and dexterity required from the operator.
3Object-affected harmful factors
If probe wire gauge is reduced to minimize damage risk to DUT, then harm to DUT is reduced, but connection reliability deteriorates due to poor solder joint quality
Solution Approach 1:
The probe tip is designed as a disposable component with adequate wire gauge and robust construction for its intended short service life. Since it is replaced rather than reused extensively, the wire can be of sufficient thickness to ensure good signal fidelity and low damage risk during each use, without requiring long-term durability that would necessitate extremely fine wire.
Solution Approach 2:
By eliminating soldering entirely and using direct mechanical contact, the patent removes the variable of solder joint quality that plagues fine-gauge wire connections. The electrical connection is made through the mechanical contact itself, so wire gauge can be optimized for signal fidelity and safety without being constrained by solder joint reliability issues.
4Adaptability or versatility
If a browser probe is used to improve probe placement flexibility, then adaptability is improved, but connection reliability may deteriorate due to manual positioning challenges
Solution Approach 1:
The probe incorporates a flexible arm that can dynamically adjust its position and angle to reach test points in various locations and orientations on the DUT. This dynamic flexibility allows the probe to adapt to different test point geometries while maintaining a stable connection through the pressing mechanism, combining adaptability with connection reliability.
Data Source
Figure 1
Figure 2
Figure 3A~3B
AI summary
A probe for making electrical contact with a device-under-test test point includes a body, a rigid member capable of travelling linearly with respect to the body, a flexible arm having a test point contact at one end and fastened to the rigid member at the other end, and a flexible linkage fixed to the body and to the flexible arm. The flexible linkage is structured to cause the flexible arm to bend in response to travel of the rigid member in one direction, and to cause the flexible arm to unbend in response to travel of the rigid member in the other direction. A second flexible arm may be included, the two arms opening and closing to change the distance between test point contacts. A light source may be disposed on a portion of the flexible linkage that simultaneously articulates to automatically track the orientation of the test point contact.