Position-Adjustable Probing Device for PCB Testing
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Solution Overview
Problem
Conventional probing devices for testing printed circuit boards face issues with inconsistent needle scrub and signal interference due to varying spacings and angles of contact pads, leading to unstable test results and reduced probe lifetime.
Innovation Solution
A position-adjustable probing device with a stationary probe and movable probes, featuring a coaxial structure with dielectric and conductive layers, and extending structures to adjust pitch and angle, reducing weight and interference by using plastic steel materials and tapered designs to ensure consistent contact and prevent signal interference.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Strength
If a solid metal conductor frame is used in the stationary probe, then the structural strength is improved, but the weight increases causing inconsistent needle scrub and reduced probe lifetime
Solution Approach 1:
The conductor frame is segmented by removing the central portion, retaining only the peripheral conductive structure. This divides the originally solid frame into a hollow configuration, reducing weight while preserving the necessary conductive pathways for signal transmission and grounding.
Solution Approach 2:
The central portion of the conductor frame is extracted/removed, keeping only the essential peripheral conductive elements. This extraction eliminates unnecessary weight from the center region while maintaining the functional conductive structure needed for electrical connections.
2Stability of the object's composition
If the conductor frame is made lighter by removing material, then the needle scrub consistency is improved, but the structural strength decreases
Solution Approach 1:
The probe structure combines different materials with complementary properties: the peripheral conductor frame provides electrical conductivity and structural support, while the plastic steel material (a composite of plastic and steel fibers) provides enhanced strength-to-weight ratio and consistent mechanical contact characteristics, achieving both lightweight design and structural integrity.
3Reliability
If multiple signal loops are formed between the conductor frame and movable probes, then the electrical connection is improved, but signal interference increases affecting test results
Solution Approach 1:
The central portion of the conductor frame that creates parasitic signal loops is extracted/removed. By eliminating the central conductive material, the design reduces the formation of multiple interfering signal loops while retaining the essential peripheral conductive pathways needed for reliable electrical connections.
Solution Approach 2:
The plastic material in the hollow conductor frame acts as an intermediary that electrically isolates different conductive pathways, preventing unwanted signal coupling and interference between adjacent signal and ground conductors while maintaining mechanical structural integrity.
4Adaptability or versatility
If different probe configurations are prepared for diverse testing needs, then the adaptability is improved, but the device complexity and cost increase
Solution Approach 1:
The probing device incorporates movable probes that can dynamically adjust their positions and orientations, replacing the need for multiple fixed static probe configurations. This dynamic adjustability allows a single probe device to adapt to various contact pad spacings and angles, reducing overall device complexity.
Solution Approach 2:
The hollow conductor frame design combined with adjustable movable probes creates a universal probing solution that can handle multiple testing scenarios. The standardized hollow frame structure serves as a versatile base that works with different probe configurations, reducing the need for specialized probe designs for each testing requirement.
Data Source
AI summary
A position-adjustable probing device comprises a stationary probe comprising a first coaxial structure having a first needle core, a first dielectric layer, and a first exterior conductive layer, and a first and a second movable probes. The first movable probe arranged at a first side of the stationary probe comprises a ground needle core, and a first extending structure comprising a first planar structure electrically contacted with the stationary probe through a first movement, a first top surface and a first bottom surface. The second movable probe arranged at a second side of the stationary needle comprises a second coaxial structure comprising a second needle core, a second dielectric layer, and a second exterior conductive layer, and a second extending structure comprising a second planar structure electrically contacted with the stationary probe through a second movement, a second top surface, and a second bottom surface.