Adjustable Slicing Direction for 3D AXI Inspection
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Solution Overview
Problem
Conventional inline 3D AXI inspection methods using horizontally sliced images can lead to poor inspection efficiency and difficulty in reviewing results when the target lacks significant horizontal features, making it challenging to detect defects effectively.
Innovation Solution
The inspection method involves generating reconstructed volumes of examining targets using X-ray scans and controlling the slicing direction to create non-horizontal, such as vertical, sliced images that highlight significant features, allowing for improved defect detection and easier review of inspection results.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If horizontally sliced images are used for inspection, then the inspection process is simple and standardized, but the inspection efficiency deteriorates and defect detection capability worsens when the target lacks significant horizontal features
Solution Approach 1:
The patent applies dynamics by making the slicing direction adjustable rather than fixed. The system can dynamically switch between horizontal, vertical, and angled slicing directions based on the specific inspection needs and target characteristics, thereby optimizing inspection efficiency for different defect types while maintaining process simplicity through automated direction selection
Solution Approach 2:
The patent changes the parameter of slicing direction from a fixed horizontal orientation to a variable parameter that can be adjusted to vertical or angled orientations. This parameter change enables the inspection system to adapt to different target geometries and defect orientations, significantly improving defect detection capability without complicating the overall inspection workflow
2Loss of time
If horizontally sliced images are used for inspection, then the inspection algorithm runs quickly, but the inspection result becomes difficult to review and defect detection capability deteriorates
Solution Approach 1:
The system dynamically adjusts the slicing direction to vertical or angled orientations when reviewing inspection results, making defects more visible and easier to analyze. This dynamic adaptation allows inspectors to efficiently review results without re-running the entire inspection process, reducing time loss while improving reviewability
Solution Approach 2:
The patent introduces another dimension by switching from horizontal to vertical or angled slicing perspectives. This dimensional change provides different viewing angles of the same inspected object, making previously invisible or hard-to-detect defects apparent while maintaining quick review capability through the same inspection dataset
3Measurement precision
If vertical slice imaging is used to improve defect detection, then the significant features of the examining target are revealed, but the inspection algorithm complexity increases
Solution Approach 1:
The patent applies preliminary action by pre-processing the 3D scanned image data into multiple slicing direction views before the actual defect detection algorithm runs. This preliminary preparation organizes the data in a way that makes defects more apparent, allowing the detection algorithm to work more efficiently with simpler logic while achieving higher measurement precision
Solution Approach 2:
The patent resolves algorithm complexity by implementing dimensionality change at the data visualization level rather than at the core detection algorithm level. The same detection algorithm can work on simpler horizontal slices for speed, while vertical or angled slices provide enhanced visual confirmation, effectively distributing the complexity management across different processing stages
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances inspection performance by revealing critical characteristics and features, facilitating faster and more accurate defect detection, particularly for defects like head-in-pillow, insufficient insertion, open, and non-wetting defects, which are difficult to identify with horizontal slices alone.
Implementation Method 1
a scanning device is provided which scans an examining target to generate a scanned image of the examining target
Implementation Method 2
the slicing portion is configured to slice the reconstructed volume into a sliced image
Data Source
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Figure 2A~2B
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AI summary
An inspection method is provided herein. The inspection method is adapted for an inspection device. The inspection method includes: optically scanning an examining target for generating a scanned image; reconstructing the scanned image for a reconstructed volume; adjusting a slicing direction associated with the examining target for slicing the reconstructed volume into a sliced image; inspecting the sliced image for analyzing one or more features of the examining target; and outputting an inspection result of the examining target.