Adjustable Spacer for Probe Length Restoration in Testing Heads
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Solution Overview
Problem
Testing heads with vertical probes face limitations in the number of cleaning operations due to material accumulation on contact tips, leading to reduced performance over time, as traditional cleaning methods consume probe material and are limited in frequency.
Innovation Solution
Incorporation of a removable spacer element between the containment element and guides allows for adjustable length of contact probes, enabling multiple cleaning operations without functional loss, using screws for retention and potentially multilayered spacer elements for precise adjustments.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional cleaning methods are used on contact tips, then material accumulation is removed, but probe material is consumed and cleaning operations are limited in frequency
Solution Approach 1:
The testing head is divided into modular components: a fixed part containing the guides and containment element, and a movable part consisting of the spacer element that can be independently adjusted. This segmentation allows the spacer to be modified or replaced without affecting the main structure, enabling repeated cleaning operations without consuming critical probe material.
Solution Approach 2:
The spacer element's length parameter can be adjusted to compensate for material consumption during cleaning operations. By modifying this geometric parameter, the system maintains proper contact probe length and alignment even after multiple cleaning cycles, thus resolving the contradiction between cleaning frequency and material loss.
2Reliability
If contact probes are made movable inside guide holes, then bending and sliding are enabled for good electrical contact, but the structure becomes more complex
Solution Approach 1:
The guide holes serve multiple functions: they constrain the contact probes to maintain alignment, allow controlled bending through the air space, and enable sliding motion for contact adjustment. By making the guide structure multi-functional, the patent reduces overall device complexity while maintaining reliable electrical contact.
3Duration of action of moving object
If spacer element is made removable and adjustable, then probe length can be restored after cleaning, but assembly and disassembly operations are required
Solution Approach 1:
The spacer element transitions from a static component to a dynamic, adjustable component. Its removability and adjustability allow the system to adapt to wear and cleaning requirements, extending the testing head's operational life. The dynamic nature of the spacer enables simple assembly and disassembly operations that are easier than complete probe replacement.
Data Source
AI summary
It is described a testing head for a testing equipment of an electronic device comprising at least one upper guide and a lower guide provided with guide holes, a plurality of contact probes inserted into the guide holes of the upper and lower guides and at least one containment element of the probes being is disposed between the upper and lower guides, each of the contact probes having at least one terminal portion which ends with a contact tip adapted to abut on a respective contact pad of the electronic device to be tested; at least one spacer element sandwiched between the containment element and at least one of the upper and lower guides, the spacer element being removable to adjust a length of the terminal portions of the contact probes projecting from the lower guide.