Adjustable Test Socket for Solid-State Image Pickup Devices
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Solution Overview
Problem
Conventional test sockets for solid-state image pickup devices face challenges in accurately locating and fixing devices with varying shapes, especially when mounted with circuit boards, due to play in the recesses, leading to difficulties in optical centering and increased need for dedicated sockets for different shapes.
Innovation Solution
A test socket design featuring first and second fixing portions that support and urge diagonal corners of the device, along with urging and position setting means to control the position of the locating means, allowing precise location and adjustment of the device's focal point and angle of view, and contact terminals arranged in a matrix for flexible use across different device shapes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a conventional test socket with fixed recesses is used, then the structure is simple, but the locating precision deteriorates due to play in the recesses
Solution Approach 1:
The locating means is made movable along the urging direction instead of being fixed, allowing it to dynamically adjust its position to eliminate play and contact the device under test at the optimal location for precise locating
2Measurement precision
If dedicated test sockets are fabricated for each device shape, then the locating precision is improved, but the device complexity and variety increases
Solution Approach 1:
The test socket is designed with adjustable locating means that can be positioned at different locations along the urging direction, enabling a single socket design to accommodate multiple device shapes and sizes by adjusting the locating means position rather than requiring dedicated sockets for each device type
Solution Approach 2:
The locating means is made adjustable along the urging direction, transforming a static socket design into a dynamic one that can adapt to different device configurations, thereby reducing the need for multiple dedicated socket designs
3Measurement precision
If the locating means contacts the circuit board, then the device can be located, but the optical centering becomes difficult due to interference with the circuit board
Solution Approach 1:
The locating means is made adjustable along the urging direction, allowing operators to dynamically position it to contact the device body at locations that do not interfere with the circuit board, thus enabling both accurate locating and easy optical centering
Solution Approach 2:
The locating means can be positioned to contact different local areas of the device depending on the specific device configuration, allowing selection of contact points that avoid circuit board interference while maintaining locating functionality
Data Source
AI summary
Provided is a test socket capable of being used more flexibly for solid-state image pickup devices of different shapes and of performing locating of the solid-state image pickup devices more precisely. The test socket houses a device under test (DUT) which is a solid-state image pickup device while a test is being performed. The test socket comprises: first locating means for locating the DUT in an X direction parallel to a ceiling plane of the DUT in a housed state; urging means for urging the first locating means in a Z direction perpendicular to the ceiling plane of the DUT in the housed state; and position setting means for setting an upper limit of movement in the Z direction of the first locating means caused by the urging means to set a position in the Z direction of the first locating means relative to the DUT.