ADPLL Dither Compensation for TDC Quantization Noise

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Solution Overview

Problem

All-digital phase locked loops (ADPLLs) suffer from significant in-band spurious tones due to the finite resolution of time-to-digital converters (TDCs), which degrade the accuracy of phase information and introduce quantization noise, worsened by analog mismatches and non-linearities.

Innovation Solution

Introducing a dither signal to corrupt the digital word generated by the TDC, either by delaying the reference clock or oscillating signal, and using a pseudo-random dither signal with adjustable gain to randomize quantization errors and counteract non-linearities, minimizing in-band noise through a look-up table and digital feed-forward compensation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If a time-to-digital converter (TDC) with finite resolution is used in an all-digital phase locked loop, then the ADPLL can be implemented with digital components and minimal analog blocks, but quantization noise is introduced that degrades phase information accuracy

Engineering Contradiction:
Improveease of manufactureVSAvoidphase information accuracy
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The patent combines multiple TDC readings with different resolutions (integer counter and fractional counter) to create a composite measurement that achieves higher effective resolution than either component alone. This composite approach allows the system to maintain digital implementation simplicity while improving phase measurement accuracy beyond what a single finite-resolution TDC could provide.

Inventive Principle:
Principle #40Composite materials

2Measurement precision

If the TDC resolution is increased to reduce quantization noise, then phase measurement accuracy improves, but the device complexity and hardware resources increase

Engineering Contradiction:
ImproveTDC resolutionVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent segments the TDC measurement function into two separate counters: an integer counter that handles coarse phase measurements and a fractional counter that handles fine phase measurements. This segmentation allows each counter to be optimized for its specific resolution requirement, achieving high overall measurement precision without requiring a single overly complex high-resolution TDC.

Inventive Principle:
Principle #1Segmentation

3Measurement precision

If a fractional counter is used to improve TDC resolution, then quantization noise is reduced, but the device complexity increases due to additional hardware components

Engineering Contradiction:
ImproveTDC resolutionVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent merges the integer counter and fractional counter outputs through a weighted combination process, where the fractional counter output is scaled and added to the integer counter output. This merging strategy integrates the fine-resolution fractional measurements with the coarse integer measurements to produce a high-precision phase measurement without requiring separate independent processing paths, thereby reducing overall system complexity.

Inventive Principle:
Principle #5Merging (Combining)

4Measurement precision

If analog calibration methods are used to correct TDC non-linearities, then measurement accuracy improves, but the complexity of the calibration system increases

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidcalibration system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces analog calibration mechanisms with a fully digital calibration approach. Instead of using analog components to correct TDC non-linearities, the invention uses digital lookup tables and computational algorithms to measure and compensate for non-linearities in the integer and fractional counters. This substitution of digital for analog calibration reduces hardware complexity while maintaining or improving measurement accuracy.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Data Source

PatentEP2194646B1Method of improving noise characteristics of an ADPLL and a relative ADPLL
Publication Date: 2013.01.02 STMICROELECTRONICS SRL
  • EP2194646B1 patent drawingFigure 1~2
  • EP2194646B1 patent drawingFigure 3~4
  • EP2194646B1 patent drawingFigure 5(a)~5(c)

AI summary

A method of improving noise characteristics of an all-digital phase locked loop generating a feedback word representing a continuous-time oscillating signal, including a time-to-digital converter input with the continuous-time oscillating signal and a reference signal function of a reference clock, the time-to-digital converter generating a digital word representing either the ratio between the oscillating signal and the reference signal or the DCO output phase, the feedback word being a function of said digital word, comprises the step of corrupting with a dither signal at least one among the reference clock, the digital word and the oscillating signal. This method is implemented by a respective feedback circuit for an all-digital phase locked loop.