Aged Circuit Detection via Sub-threshold Current Analysis
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Solution Overview
Problem
Conventional methods for detecting aged circuits, such as those used in integrated circuits (ICs), are often inaccurate when dealing with small circuits embedded in larger chips and require destructive reverse engineering, which is time-consuming and limited to small batches.
Innovation Solution
A system and method that analyze the current-voltage characteristic curve for distortions in the sub-threshold quiescent current signature of circuits, allowing for the identification of aged circuits without destructive inspections, using a processor and memory to execute computer executable components that compare measured curves with reference curves or defined thresholds.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional power supply activity or signal path delay methods are used to detect aged circuits, then detection can be performed on some circuits, but detection accuracy deteriorates when circuits are small and embedded in large chips
Solution Approach 1:
The patent changes the detection parameter from power supply activity or signal path delay to sub-threshold quiescent current characteristics. By measuring the quiescent current in the sub-threshold voltage region and analyzing its derivative with respect to voltage, the method achieves high detection accuracy for embedded circuits without being hindered by their small size or integration into large chips.
2Measurement precision
If destructive reverse engineering techniques are used to inspect aged circuits, then detailed analysis at transistor and metal levels can be achieved, but the process becomes time-consuming and limited to small batches
Solution Approach 1:
The patent replaces the mechanical destructive inspection process (delayering and microscopy) with an electrical measurement system. By measuring sub-threshold quiescent current characteristics, the method achieves sufficient detection accuracy without physical destruction, enabling high-throughput inspection of large batches of circuits.
Solution Approach 2:
The patent creates an electrical signature (quiescent current vs. voltage curve) that serves as a copy or representation of the circuit's physical state. By analyzing this electrical copy, particularly its derivative in the sub-threshold region, the system can identify aged circuits without needing to physically examine or destroy the actual hardware.
3Reliability
If destructive reverse engineering is applied, then aged circuits can be analyzed, but the actual chip intended for real applications cannot be inspected
Solution Approach 1:
The patent enables the circuit to self-reveal its age through its own electrical characteristics. By measuring the quiescent current in the sub-threshold region, the circuit itself provides the information needed for detection without requiring external destructive analysis, thus preserving the chip for its intended application.
Data Source
AI summary
Techniques regarding autonomous identification of aged circuits are provided. For example, one or more embodiments described herein can comprise a system, which can comprise a memory that can store computer executable components. The system can also comprise a processor, operably coupled to the memory, and that can execute the computer executable components stored in the memory. The computer executable components can comprise an identification component, operatively coupled to the processor, that can identify an aged circuit by analyzing a current-voltage characteristic curve for a distortion in a sub-threshold quiescent current signature of the aged circuit.