AI Image Analysis for Microscopic Modification Detection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing methods for analyzing object elements to detect authenticity or falsification only perform partial 'macroscopic' analysis, failing to detect microscopic modifications, and require expensive infrared microscopy equipment.
Innovation Solution
A method utilizing a learning artificial intelligence module to analyze selected image features of a digital image, including color, texture, gradation, glyph, inter-glyph distance, drawing line, and halftone dots, to determine both macroscopic and microscopic changes in an element, using convolutional neural networks and other neural networks for decision-making.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If macroscopic analysis method is used, then device complexity is reduced, but measurement precision deteriorates
Solution Approach 1:
The analysis is segmented into multiple levels: macroscopic analysis of overall element structure and microscopic analysis of fine details like text, patterns, and surface features. This segmentation allows the system to maintain low device complexity while achieving high measurement precision by analyzing different scales separately
Solution Approach 2:
The patent transitions from single-scale macroscopic analysis to multi-scale analysis by introducing microscopic dimension. This dimensional expansion enables detection of both large-scale modifications and fine-detail alterations without requiring complex infrared microscopy equipment
2Measurement precision
If infrared microscopy equipment is used, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
Instead of using complex infrared microscopy equipment, the patent captures optical images and creates detailed digital copies that can be analyzed computationally. This copying approach achieves microscopic analysis capability while avoiding the complexity and cost of specialized infrared microscopy hardware
Solution Approach 2:
The patent replaces the mechanical/optical infrared microscopy system with a computational image analysis system. By substituting physical microscopy equipment with AI-based image processing, the system achieves comparable or superior measurement precision with reduced device complexity
3Measurement precision
If AI analysis of multiple image features is performed, then measurement precision is improved, but loss of time increases
Solution Approach 1:
The system performs preliminary analysis by first examining macroscopic features to quickly identify obvious modifications, then selectively analyzes microscopic features only when needed. This preliminary action reduces overall analysis time while maintaining high precision by avoiding unnecessary detailed examination of clearly authentic elements
Data Source
AI summary
A method analyzes an element associated with an object and representative of the latter. The method includes receiving first data defining a digital image of at least a part of the element resulting from a photographic capture, providing the first data to an analyzer including at least one learning artificial intelligence module, previously configured with second training data of at least one reference element, in order to make a decision relating to the first data received from a selection of at least a portion of these first data defining a chosen zone of interest and characterized by at least one chosen image feature, this decision being related to a potential modification of the analyzed element with respect to a corresponding reference element.

