AI Surface Defect Analysis for Textiles

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Solution Overview

Problem

Existing methods for analyzing surface defects in two-dimensional products, such as textiles and leather components, are not fully automated and interactive, limiting their effectiveness in detecting defects exhaustively and accurately.

Innovation Solution

A method utilizing artificial intelligence-based image analysis, involving multiple deep learning models for defect localization, background elimination, and irrelevant defect filtering, integrated with interactive software for operator feedback and data storage, enabling exhaustive and automated defect analysis on personal and mobile devices.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Extent of automation

If existing methods for analyzing surface defects are used, then some defect detection capability is provided, but the process cannot be fully automated and interactive

Engineering Contradiction:
Improveautomation of defect analysis processVSAvoidinteractivity for operator feedback
Core Design Contradiction:
Extent of automationVSEase of operation

Solution Approach 1:

The defect analysis process is segmented into multiple specialized deep learning models: a first model for defect localization, a second model for background elimination, and a third model for filtering irrelevant defects. This segmentation allows each model to specialize in a specific aspect of analysis while maintaining overall automation, resolving the contradiction between automation extent and operational interactivity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system incorporates feedback mechanisms where operators can interact with the analysis results, provide corrections, and feed this information back into the system. This feedback loop maintains high automation while preserving necessary human oversight and interactivity, allowing the system to learn and improve from operator input.

Inventive Principle:
Principle #23Feedback

2Measurement precision

If multiple deep learning models are used for comprehensive defect analysis, then detection accuracy is improved, but device complexity increases

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidnumber of deep learning models
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

Instead of using one complex monolithic model, the system segments the analysis into three specialized models, each handling a specific aspect (localization, background elimination, filtering). This segmentation improves accuracy for each specific task while making the overall system more manageable and less complex than a single comprehensive model would be.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The deep learning models are designed to be universal and can be applied across different product types and defect scenarios. This multi-functionality allows the same framework to handle various analysis tasks, reducing the need for multiple specialized systems and thereby controlling complexity while maintaining high detection accuracy.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Reliability

If interactive software with operator feedback is implemented, then analysis completeness is improved, but processing time increases

Engineering Contradiction:
Improvecompleteness of defect identificationVSAvoidprocessing time for analysis
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The system performs preliminary automated analysis using deep learning models to identify and flag potential defects before operator review. This preliminary action filters out obvious cases and prepares structured information for operators, reducing the time they need to spend on each case while ensuring completeness through their final verification.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system provides self-service capabilities where operators can review, confirm, or correct automated analysis results at their own pace. The automated models handle routine identification tasks, allowing operators to focus only on ambiguous or critical cases, thereby maintaining reliability without significantly increasing overall processing time.

Inventive Principle:
Principle #25Self-service

Data Source

PatentEP4459547A1Method for the analysis of surface defects
Publication Date: 2024.11.06 AITEM SRL
  • EP4459547A1 patent drawingFigure 1~2
  • EP4459547A1 patent drawing
  • EP4459547A1 patent drawing

AI summary

Method for the analysis of surface defects of substantially two-dimensional products, the method being suitable for implementation on personal computers or other similar devices, the method comprising the following phases: - arranging a product in substantially two-dimensional development on a work surface, near an optical means, - acquiring images of the product in substantially two-dimensional development by means of the optical means, - analyzing the images by means of software, based on artificial intelligence, implemented on a computer or other analysis device, including mobile device, - visualizing the result of the defect analysis on a screen, - storing the collected data on physical devices for production documentation, and - archiving the collected data on virtual devices.