Offset Aim Line Units for Barcode Scanner Parallax Reduction
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing barcode scanning devices face challenges in precisely aiming at barcodes due to shifts in the aiming pattern relative to the central imaging axis as a function of distance, leading to complex and costly electromechanical systems with increased processing time, which affects reliability and usability.
Innovation Solution
The implementation of a scanning device with offset aim line units that project bounded light patterns intersecting the central imaging axis, forming a cross pattern to accurately indicate the field of view center, reducing parallax and eliminating the need for complex alignment mechanisms.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If offset aim line units are used to indicate field of view center, then aiming precision is improved, but device complexity increases due to additional optical components
Solution Approach 1:
The aiming function is segmented into multiple independent aim line units positioned at different locations relative to the image sensor. Each aim line unit projects a separate bounded light pattern, allowing independent optimization of each unit while collectively providing comprehensive aiming information across the field of view.
Solution Approach 2:
Bounded light patterns serve as intermediary visual indicators between the optical system and the user. These light patterns mediate the relationship by providing intuitive visual cues about field of view boundaries and center points without requiring complex electronic displays or processing.
2Measurement precision
If electromechanical components and software correction are used to address aiming shifts, then measurement precision is improved, but processing time increases
Solution Approach 1:
The aim line units are pre-positioned and pre-configured to project bounded light patterns that inherently compensate for parallax and aiming shifts. This preliminary geometric configuration eliminates the need for real-time computational correction, as the aiming accuracy is built into the optical geometry itself.
Solution Approach 2:
The patent replaces electromechanical alignment mechanisms and software-based correction algorithms with a purely optical geometric solution. By using the physical positioning and angular orientation of aim line units relative to the image sensor, the system achieves aiming precision without mechanical adjustment or computational processing.
3Manufacturing precision
If complex electromechanical components are used for alignment, then manufacturing precision is improved, but device complexity and cost increase
Solution Approach 1:
The system changes the parameters of the aim line units, specifically their positions and angular orientations relative to the image sensor, to achieve precise alignment. By optimizing these geometric parameters, the system achieves manufacturing precision through simple optical geometry rather than complex mechanical alignment mechanisms.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration allows for precise aiming and efficient scanning by eliminating parallax and reducing processing time, enabling faster and more reliable barcode capture across varying distances without the need for complex electromechanical components.
Implementation Method 1
The first aim line unit is oriented to project a first bounded light pattern that intersects the central imaging axis at an imaging plane. The second aim line unit is oriented to project a second bounded light pattern that intersects the first light pattern and the central imaging axis at the imaging plane.
Data Source
AI summary
A method and apparatus for capturing an image of at least one object appearing in a field of view (FOV). A housing may be provided having an image sensor at least partially disposed therein. The imaging sensor has a central imaging axis. A first and a second aim line unit are each offset from the image sensor. The first aim line unit is oriented to project a first bounded light pattern that intersects the central imaging axis at an imaging plane. The second aim line unit is oriented to project a second bounded light pattern that intersects the first light pattern and the central imaging axis at the imaging plane.