Air-Atmosphere XRF for Light-Element Analysis Without Helium
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Solution Overview
Problem
Existing X-ray fluorescence (XRF) analysis apparatuses face challenges in accurately and cost-effectively analyzing trace amounts of light elements, particularly in industries like petroleum and biofuels, due to the need for helium, which is expensive and inconvenient to store, and the difficulty in achieving compliance with national/international standards without helium.
Innovation Solution
An X-ray fluorescence analysis apparatus that operates in an air atmosphere, using an X-ray source with an anode of atomic number less than 25, an X-ray filter to attenuate specific energy ranges, and environmental compensation based on air pressure and temperature measurements to adjust X-ray intensity, eliminating the need for helium and vacuum sealing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If helium is used in the measurement chamber, then the detection precision for light elements is improved, but the device complexity and operational cost increase due to helium storage and safety requirements
Solution Approach 1:
The invention extracts the light element detection capability from the helium-dependent system by using an aluminum anode with specific filter configuration, allowing air-atmosphere operation while maintaining detection precision for elements with atomic number ≤ 18
Solution Approach 2:
The invention changes the operating parameters by using an aluminum anode (atomic number 13) with optimized filter thickness (0.5-2.0 mm) to shift the X-ray spectrum characteristics, enabling effective light element detection in air atmosphere without helium
2Measurement precision
If measurement time is extended to improve precision, then the measurement precision is improved, but the productivity decreases
Solution Approach 1:
The invention performs preliminary optimization of the X-ray spectral parameters through anode material selection and filter configuration, which enhances the signal intensity for light elements and allows achieving required precision within shorter measurement times
Solution Approach 2:
By optimizing measurement parameters such as tube voltage (40-50 kV), tube current (100-200 μA), and filter thickness, the invention achieves high precision measurements within 30-60 seconds, balancing precision and throughput requirements
3Use of energy by moving object
If a low power X-ray source is used, then the energy consumption is reduced, but the measurement precision for trace elements deteriorates
Solution Approach 1:
The invention uses an aluminum anode with optimized filter thickness to enhance the characteristic X-ray emission efficiency, allowing effective trace element detection with low power consumption (40-50 kV, 100-200 μA) while maintaining detection limits below 50 mg/kg
Solution Approach 2:
The combination of aluminum anode material with specific filter materials (aluminum, magnesium, or beryllium) creates an optimized X-ray spectral configuration that maximizes light element signal intensity while minimizing power requirements
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables high analytical performance for low-atomic number elements with low power consumption, ensuring repeatability and reproducibility, and compliance with standards like ISO 13032:2012, at a lower cost and enhanced convenience.
Implementation Method 1
X-ray fluorescence (XRF) analysis is an elemental analysis technique used to obtain information about the composition of a sample. During XRF analysis, the sample is irradiated with X-rays to cause the sample to fluoresce (i.e. to emit characteristic X-rays).
Implementation Method 2
an X-ray filter arranged between the X-ray source and the sample, wherein the X-ray filter is configured to transmit the primary X-ray beam and to attenuate at least some X-rays having energies between 2 keV and 3 keV
Implementation Method 3
a sensor arrangement configured to measure air pressure and air temperature; and a processor configured to: receive the measured X-ray intensity; receive an air pressure measurement and an air temperature measurement from the sensor arrangement
Data Source
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AI summary
There is provided an X-ray fluorescence analysis apparatus for analysing a sample, and a method of X-ray fluorescence analysis. The X-ray fluorescence analysis apparatus comprises an X-ray source, a measurement chamber for holding the sample in air, and an X-ray detector. The X-ray source is arranged to irradiate the sample with a primary X-ray beam, to cause the sample to fluoresce. The X-ray detector is arranged to detect characteristic X-rays emitted by the sample and to determine a measured X-ray intensity associated with the characteristic X-rays. An X-ray filter, which transmits the primary X-ray beam, is arranged between the X-ray source and the sample. The X-ray source comprises an anode of material having an atomic number that is less than 25. The X-ray fluorescence analysis apparatus further comprises a sensor arrangement configured to sense air pressure and air temperature. A processor receives the measured X-ray intensity. The processor also receives air pressure data and air temperature data from the sensor arrangement. The processor is configured to carry out a compensation calculation for adjusting the measured X-ray intensity using the air pressure data and the air temperature data.