ALD Chamber Region Segmentation for Multi-Thickness Deposition

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Solution Overview

Problem

The conventional atomic layer deposition (ALD) process faces inefficiencies in handling different layer deposition thicknesses for wafers within a batch load, leading to low wafer capacity utilization and unsatisfactory tool efficiency, particularly during the sidewall oxidation stage, where only fifty pieces with the same thickness can be processed due to the limitations of uniform size injectors and prolonged quality check times.

Innovation Solution

The ALD apparatus features a chamber with multiple regions and a heating device providing specific temperature ranges, along with injectors having holes of different geometric parameters to allow for the simultaneous deposition of two or more thicknesses of films in a single batch, utilizing region temperature tuning and hole size optimization to enhance deposition efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If uniform size injectors are used in the chamber, then the device structure is simple, but the ability to handle different layer deposition thicknesses is limited

Engineering Contradiction:
Improveability to handle different layer deposition thicknessesVSAvoidinjector structure complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The chamber is divided into multiple regions, and the injector is segmented into multiple holes with different geometric parameters. Each hole is configured to deliver precursor material to specific regions, enabling simultaneous deposition of different film thicknesses on different wafers within the same batch. This segmentation allows the system to handle diverse deposition requirements without requiring completely different injector designs for each thickness requirement.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different holes in the injector are designed with specific geometric parameters (size, shape, position) tailored to the local requirements of each chamber region. This local quality approach ensures that each region receives the appropriate precursor material flow for its intended deposition thickness, while the overall injector structure remains integrated and manageable.

Inventive Principle:
Principle #3Local quality

2Productivity

If multiple different thicknesses are formed in one batch, then the wafer capacity utilization increases, but the process control difficulty increases

Engineering Contradiction:
Improvewafer capacity utilizationVSAvoidprocess control complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The batch processing is segmented into different regional processes within the same chamber. By dividing the chamber into multiple regions with different temperature profiles and precursor delivery rates, the system can simultaneously process wafers requiring different thicknesses without requiring separate processing batches, thereby maintaining high capacity utilization while managing control complexity through regional independence.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system utilizes parameter changes in temperature and precursor flow rate across different chamber regions to achieve different deposition thicknesses. The heating device provides specific temperature ranges for different regions, and the injector delivers precursor material at different rates to different regions, allowing precise control of deposition thickness without increasing overall process complexity.

Inventive Principle:
Principle #35Parameter changes

3Manufacturing precision

If region temperature tuning is implemented, then the deposition precision for different thicknesses is improved, but the heating device complexity increases

Engineering Contradiction:
Improvedeposition thickness precisionVSAvoidheating device complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The heating device is segmented into multiple heating zones corresponding to different chamber regions. Each heating zone can be independently controlled to provide specific temperature ranges required for different deposition thicknesses. This segmentation enables precise temperature control for each region without requiring a completely separate heating system for each thickness requirement.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The heating device provides local quality temperature control, where each chamber region receives the specific temperature profile needed for its intended deposition thickness. This local temperature optimization ensures precise deposition control in each region while the heating device maintains an integrated structure through coordinated control of multiple heating zones.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach increases the ALD process efficiency to 90% and daily throughput, enabling the formation of multiple thicknesses in a single batch cycle, thereby improving capacity utilization and tool efficiency by aligning processing times for different thicknesses.

Implementation Method 1

The heating device respectively provides specific temperature ranges for the plurality of regions

Methodology Applied
Scientific EffectTemperature control: Heating

Implementation Method 2

The ALD process employs a precursor material which can react with or chemisorb on a surface in process to build up successively deposited layers

Methodology Applied
Scientific EffectChemisorption: Chemisorption

Data Source

PatentUS10858736B2Atomic layer deposition method
Publication Date: 2020.12.08 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US10858736B2 patent drawing
  • US10858736B2 patent drawing
  • US10858736B2 patent drawing

AI summary

An atomic layer deposition apparatus includes a chamber including a plurality of regions; and a heating device respectively providing specific temperature ranges for the plurality of regions. By flowing precursor gases at different flow rates in the different regions, thin films can be simultaneously formed in the different regions having different film thicknesses.