Algebraic Air-Kerma Rate Calculation for X-Ray Systems
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional systems for determining the air-kerma rate of x-ray devices are either overly complex or prone to failures due to x-ray beam attenuation, lacking an accurate and failure-safe method for measurement.
Innovation Solution
An algebraic formula is used to calculate the air-kerma rate based on x-ray tube current and voltage, with calibration parameters stored for multiple calculations, allowing for a simplified and reliable determination without the need for separate measuring components, and enabling comparison with threshold values.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a neural network is used to predict air-kerma area product, then measurement precision is improved, but device complexity increases significantly
Solution Approach 1:
The patent extracts the essential measurement function from complex neural network systems and implements it through a simplified algebraic formula that directly calculates air-kerma rate from basic x-ray parameters, eliminating the need for complex prediction algorithms while maintaining measurement accuracy
Solution Approach 2:
Instead of using a physical ion chamber that attenuates the beam, the patent creates a computational model that copies the measurement function through mathematical calculation, avoiding the physical interference while preserving the measurement capability
2Measurement precision
If an ion chamber is used to directly measure air-kerma, then measurement precision is improved, but reliability deteriorates due to beam attenuation and additional failure sources
Solution Approach 1:
The patent introduces an algebraic formula as an intermediary computational method that calculates air-kerma rate from tube current and voltage without requiring physical interaction with the x-ray beam, thus eliminating beam attenuation issues and additional failure sources associated with ion chambers
Solution Approach 2:
The patent removes the ion chamber component entirely from the measurement system, extracting only the essential calculation function and implementing it through mathematical formulas that use readily available x-ray generator parameters, thereby eliminating the reliability issues inherent in physical measurement devices
3Measurement precision
If separate measuring components are used, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent makes the existing x-ray generator parameters (tube current and voltage) serve multiple functions: they control the x-ray production and simultaneously provide the input data for air-kerma rate calculation, eliminating the need for separate measuring components while maintaining measurement capability
Solution Approach 2:
The system uses its own operational parameters (tube current and voltage) to determine the air-kerma rate, making the x-ray device self-measuring without requiring external measurement instruments, thus simplifying the overall device architecture while preserving measurement precision
Data Source
AI summary
An apparatus for determining the air-kerma rate of an x-ray device comprises a data obtaining component for obtaining data of the x-ray device, a calculation component for calculating the air-kerma rate from the obtained data, and an outputting component for outputting the calculated air-kerma rate, where the calculation component uses an algebraic formula for the calculation of the air-kerma rate.