Alignment Inspection Apparatus for Laminated Plates

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Solution Overview

Problem

Existing alignment inspection systems in material laminating facilities face challenges in accurately detecting misalignment between upper and lower plates due to noise data, leading to erroneous defect recognition and reduced productivity.

Innovation Solution

An alignment inspection apparatus that includes a camera to photograph the plates, an alignment calculator to determine horizontal and vertical distances, and a misalignment detector to filter noise data and determine true defect data, ensuring accurate alignment inspection by comparing distances with predefined references.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If alignment inspection is performed using photographing and alignment mark analysis, then alignment detection capability is provided, but noise data causes erroneous defect recognition reducing accuracy

Engineering Contradiction:
Improvealignment detection accuracyVSAvoiddefect recognition reliability
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The inspection system segments the detection process into two independent modules: alignment inspection (detecting plate positions) and defect inspection (detecting actual defects). By separating these functions and applying different evaluation criteria to each, the system avoids noise data from alignment variations affecting defect recognition accuracy, thereby resolving the contradiction between alignment detection capability and defect recognition reliability

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system changes the evaluation parameters by establishing separate reference values: alignment reference values for position detection and defect reference values for defect detection. By dynamically adjusting and selecting appropriate reference values based on the inspection type, the system maintains high accuracy in both alignment detection and defect recognition without mutual interference

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If alignment inspection detects all deviations including noise data, then comprehensive detection is achieved, but productivity decreases due to erroneous defect recognition

Engineering Contradiction:
Improvedetection comprehensivenessVSAvoidinspection efficiency
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The system dynamically adjusts the inspection criteria and reference values based on the inspection stage and data type. By making the evaluation standards adaptive rather than static, the system can comprehensively detect all deviations during alignment inspection while automatically filtering out noise data that would otherwise be classified as defects, thus maintaining both comprehensiveness and productivity

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The system implements feedback mechanisms where alignment inspection results inform subsequent defect inspection parameters. By using feedback from the alignment detection stage to adjust defect detection sensitivity, the system achieves comprehensive detection without being triggered by noise data, thereby maintaining high inspection efficiency

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS10627225B2Alignment inspection apparatus and lamination inspection system having the same
Publication Date: 2020.04.21 SAMSUNG DISPLAY CO LTD
  • US10627225B2 patent drawing
  • US10627225B2 patent drawing
  • US10627225B2 patent drawing

AI summary

An alignment inspection apparatus and a lamination inspection system are provided. An alignment inspection apparatus includes: a camera configured to photograph an alignment between an upper plate and a lower plate which are laminated to generate image data of the alignment; an alignment calculator configured to calculate horizontal distances and vertical distances in a non-overlapping area where the upper plate and the lower plate do not overlap with each other using the image data to generate alignment data; and a misalignment detector configured to detect true defect data in which noise data is filtered using the horizontal distances and the vertical distances.