Alkanolamine Cleaning Composition for Plasma Etch Residue Removal

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Solution Overview

Problem

Existing cleaning formulations for removing plasma etch residues from microelectronic substrates often harm metallic layers, particularly aluminum and titanium, due to the presence of hydroxylamine and inadequate corrosion protection for AlCu alloys.

Innovation Solution

A cleaning composition comprising alkanolamine, hydroxylamine or its derivatives, polyfunctional organic acid with at least two carboxylic acid groups, and water, optionally including corrosion inhibitors, is used to effectively remove plasma etch residues without damaging metal layers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If conventional cleaning formulations containing hydroxylamine and alkanolamine are used to remove plasma etch residues, then cleaning effectiveness is improved, but corrosion of metallic layers particularly aluminum and copper is increased

Engineering Contradiction:
Improvecleaning effectivenessVSAvoidcorrosion of metallic layers
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

The patent introduces a corrosion inhibitor as an intermediary substance that mediates between the cleaning action of hydroxylamine/alkanolamine and the metallic layers. This corrosion inhibitor specifically targets and protects aluminum and copper from corrosion while allowing the primary cleaning components to effectively remove plasma etch residues, thus resolving the contradiction between cleaning effectiveness and metal protection

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent modifies the chemical parameters of the cleaning formulation by adjusting the concentrations and types of corrosion inhibitors present. By changing these compositional parameters, the formulation achieves optimal balance between maintaining strong cleaning capability against plasma etch residues and providing sufficient protection against corrosion of aluminum and copper metallic layers

Inventive Principle:
Principle #35Parameter changes

2Object-affected harmful factors

If corrosion inhibitors such as catechol and gallic acid are added to protect metal layers, then metal corrosion is reduced, but effectiveness against AlCu alloys is insufficient

Engineering Contradiction:
Improvemetal corrosion protectionVSAvoidprotection effectiveness against AlCu alloys
Core Design Contradiction:
Object-affected harmful factorsVSReliability

Solution Approach 1:

The patent employs a composite corrosion protection approach by combining multiple corrosion inhibitors (including catechol, gallic acid, and additional inhibitors specifically effective against AlCu alloys) within the cleaning formulation. This composite approach leverages the complementary properties of different inhibitors to achieve comprehensive protection against aluminum and copper, particularly AlCu alloys, while maintaining cleaning effectiveness

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The patent applies local quality protection by selecting and positioning corrosion inhibitors that specifically target different metal components. The formulation includes inhibitors with specific affinity for aluminum and copper, ensuring that each metal layer receives appropriate localized protection tailored to its specific corrosion susceptibility, thereby improving overall reliability against AlCu alloy corrosion

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The composition achieves efficient removal of plasma etch residues while minimizing etch rates of metal and dielectric materials, thereby protecting sensitive layers like AlCu alloys and maintaining the integrity of microelectronic substrates.

Implementation Method 1

polyfunctional organic acid with at least two carboxylic acid groups

Methodology Applied
Scientific EffectChelation:

Implementation Method 2

formulated solution can effectively clean plasma etching residues

Methodology Applied
Scientific EffectChemical dissolution:

Implementation Method 3

complex mixture that may include re-sputtered oxide material, organic materials from photoresist

Methodology Applied
Scientific EffectComplexation:

Data Source

PatentUS12298669B2Composition comprising three alkanolamines and a hydroxylamine for removing etch residues
Publication Date: 2025.05.13 VERSUM MATERIALS US LLC
  • US12298669B2 patent drawing
  • US12298669B2 patent drawing
  • US12298669B2 patent drawing

AI summary

A method and cleaning composition for microelectronic devices or semiconductor substrates including at least one alkanolamine; at least one hydroxylamine or derivatives of hydroxylamine or mixtures thereof; at least one polyfunctional organic acid with at least two carboxylic acid groups and water. The cleaning compositions can further include at least one corrosion inhibitor.