Epitaxial Substrate with AlN Projections for UV LED Crystallinity

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Solution Overview

Problem

Current epitaxial substrates for light-emitting diodes, particularly those using nano-patterned sapphire substrates, still exhibit high dislocation densities, which hinder the efficiency and crystallinity of ultraviolet light-emitting diodes.

Innovation Solution

An epitaxial substrate with a single crystal sapphire substrate featuring conical or pyramidal projections and a specific AlN layer structure, including a first AlN crystal covering the substrate, second AlN crystals protruding from the projections, and a third AlN crystal interconnecting these, is used to reduce dislocation density and enhance crystallinity through metal organic vapor phase epitaxy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If AlN is grown on a nano-patterned sapphire substrate, then dislocation density is reduced, but the dislocation density remains high and crystallinity is insufficient

Engineering Contradiction:
Improvecrystallinity of AlN layerVSAvoiddislocation density
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The invention segments the AlN layer into three distinct crystal structures: a first AlN crystal covering the substrate plane, multiple second AlN crystals growing from projection tips, and a third AlN crystal interconnecting the second crystals. This segmentation allows each region to serve a specific function in reducing dislocations and improving crystallinity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The invention transitions from a conventional planar AlN layer to a three-dimensional hierarchical structure with AlN crystals growing vertically from conical or pyramidal projections. The second AlN crystals extend in the thickness direction from the projection tips, creating a multi-layered architecture that effectively filters dislocations.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Ease of manufacture

If conventional planar AlN growth is used, then manufacturing is simple, but dislocation density remains high

Engineering Contradiction:
Improvesimplicity of AlN layer fabricationVSAvoiddislocation density
Core Design Contradiction:
Ease of manufactureVSObject-generated harmful factors

Solution Approach 1:

The sapphire substrate is pre-patterned with conical or pyramidal projections before AlN growth. These projections serve as predetermined nucleation sites that guide the formation of the hierarchical AlN crystal structure, ensuring that second AlN crystals grow vertically from the tips with proper orientation to filter dislocations.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The invention changes the surface morphology parameter of the substrate from planar to three-dimensional projections, and controls the crystal growth parameters to form distinct first, second, and third AlN crystal regions. This parameter transformation enables the hierarchical structure that reduces dislocations while maintaining manufacturing feasibility through established epitaxial techniques.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration significantly reduces dislocation density and improves the crystallinity of the AlN layer, leading to enhanced performance of ultraviolet light-emitting diodes by minimizing dislocations and stress-related issues.

Implementation Method 1

an AlN layer on the plane of the single crystal substrate... formed as a layer interconnecting ends of the plurality of second AlN crystals

Methodology Applied
Scientific EffectEpitaxy: Epitaxy

Data Source

PatentUS10697089B2Epitaxial substrate
Publication Date: 2020.06.30 RIKEN CO LTD
  • US10697089B2 patent drawing
  • US10697089B2 patent drawing
  • US10697089B2 patent drawing

AI summary

An epitaxial substrate includes: a single crystal substrate including projections arranged in an array on a plane. Each projection has a conical or pyramidal shape tapered in a normal direction to the plane. The AlN layer includes: a first AlN crystal covering the plane and the projections with tips of the projections being exposed; second AlN crystals protruding from the tips of the projections along the normal direction and each having a shape of a column whose cross-sectional area increases as a distance from a tip of a corresponding projection increases; and a third AlN crystal as a layer interconnecting ends of the second AlN crystals, opposite the single crystal substrate.