AlN Substrate Surface Preparation for Epitaxial Growth

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Solution Overview

Problem

Bulk crystalline Aluminum Nitride (AlN) substrates are highly reactive, leading to defects such as V-pits and high surface roughness during epitaxial growth of III-N heterostructures, which degrade device performance or preclude the formation of certain devices like ultra-violet light emitters and light sensors.

Innovation Solution

A method involving plasma treatment of the AlN substrate surface with Ar plasma and a halogen-containing gas, followed by chemical etching to remove organics and metals, and subsequent heating in an ammonia-rich ambient above 1000°C to prepare the surface for epitaxial growth of high-quality III-nitride layers, specifically InyAlxGa1−x−yN, with surface roughness less than 10 nm.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional epitaxial growth methods are used on AlN substrates, then epitaxial layers can be formed, but surface defects such as V-pits and high surface roughness occur due to the high reactivity of AlN substrates

Engineering Contradiction:
Improvesurface roughnessVSAvoiddefect formation
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The patent applies preliminary surface treatment actions including plasma treatment with Ar plasma and halogen-containing gas, followed by chemical etching with sulfuric and phosphoric acid, and ammonia-rich ambient heating at 1000°C for 5 minutes before epitaxial growth. These preliminary actions modify the substrate surface to suppress defect formation during subsequent epitaxial growth.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent changes physical and chemical parameters of the substrate surface through plasma treatment (energy parameter), chemical etching (chemical composition parameter), and high-temperature ammonia-rich ambient heating (temperature and chemical environment parameters). These parameter changes transform the reactive AlN surface into a state suitable for high-quality epitaxial growth.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If the AlN substrate surface is treated to reduce reactivity, then defect formation is suppressed, but additional processing steps and time are required

Engineering Contradiction:
Improvedefect suppressionVSAvoidprocess steps
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent combines multiple surface treatment functions into an integrated process sequence: plasma treatment removes organics and modifies surface chemistry, chemical etching removes metals and further cleans the surface, and ammonia-rich ambient heating simultaneously performs final cleaning and prepares the surface for epitaxial growth. This merged approach achieves comprehensive surface preparation while managing process complexity.

Inventive Principle:
Principle #5Merging (Combining)

3Manufacturing precision

If high temperature heating is applied to prepare the surface, then surface quality is improved for epitaxial growth, but energy consumption increases

Engineering Contradiction:
Improvesurface qualityVSAvoidheating energy
Core Design Contradiction:
Manufacturing precisionVSUse of energy by moving object

Solution Approach 1:

The high-temperature ammonia-rich ambient heating is performed as a preliminary action immediately before epitaxial growth, lasting only 5 minutes at 1000°C. This brief, targeted high-temperature treatment achieves the necessary surface preparation without prolonged energy exposure, optimizing the balance between surface quality improvement and energy consumption.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The method achieves reproducible epitaxial growth with good surface morphology and high crystal quality, reducing defects and improving device performance by suppressing nitrogen dissociation and surface defect formation.

Implementation Method 1

plasma treating a surface of a bulk crystalline Aluminum Nitride (AlN) substrate by accelerating an Ar plasma toward the surface

Methodology Applied
Scientific EffectPlasma: Plasma

Implementation Method 2

accelerating an Ar plasma toward the surface

Methodology Applied
Scientific EffectIon beam: Ion Beam

Implementation Method 3

organics and metals are removed from the surface using one or more chemical etchants

Methodology Applied
Scientific EffectChemical etching: Chemical Bonding

Implementation Method 4

heating the surface in an ammonia-rich ambient to a temperature of above 1000° C. for at least 5 minutes

Methodology Applied
Scientific EffectHeating: Heating

Implementation Method 5

an InyAlxGa1−x−yN layer is epitaxially grown on the surface

Methodology Applied
Scientific EffectEpitaxy: Epitaxy

Implementation Method 6

epitaxial growth of high-quality III-nitride layers

Methodology Applied
Scientific EffectChemical vapor deposition: Chemical Vapour Deposition

Data Source

PatentUS8822314B2Method of growing epitaxial layers on a substrate
Publication Date: 2014.09.02 GENESEE VALLEY INNOVATIONS LLC
  • US8822314B2 patent drawing
  • US8822314B2 patent drawing
  • US8822314B2 patent drawing

AI summary

An epitaxial growth method includes plasma treating a surface of a bulk crystalline Aluminum Nitride (AlN) substrate and subsequently heating the substrate in an ammonia-rich ambient to a temperature of above 1000° C. for at least 5 minutes without epitaxial growth. After heating the surface, a III-nitride layer is epitaxially grown on the surface.