Assessing Alpha Particle Emission in Metallic Materials

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

It is difficult to accurately assess and predict when alpha particle emissions from metallic materials used in electronic components will reach unacceptable levels after refining or melting processes, as existing methods are inadequate to detect lead impurities at low concentrations and fail to effectively remove alpha-emitting isotopes like 210Po.

Innovation Solution

A method involving a secular equilibrium disruption process, such as refining, followed by heat treatment to diffuse target decay isotopes, allowing for the determination of alpha particle emission potential by measuring alpha particle emissions and calculating the concentration of target parent isotopes, thereby predicting maximum alpha particle emissions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If refining or melting processes are used to remove lead impurities, then the purity of metallic materials is improved, but alpha particle emissions may still increase over time as secular equilibrium is restored

Engineering Contradiction:
Improvepurity of metallic materialVSAvoidalpha particle emission stability
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The patent applies preliminary action by disrupting secular equilibrium through refining or melting processes before the material is used in electronic devices. This preliminary disruption prevents the immediate restoration of alpha particle emissions, creating a temporary window of reduced radiation risk while the material is in use.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent utilizes parameter changes by altering the physical state of the metallic material through melting and refining processes. These parameter changes enable the removal of lead impurities and disruption of secular equilibrium, thereby temporarily reducing alpha particle emissions to acceptable levels for electronic device applications.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If detection methods are used to measure lead impurities at low concentrations, then measurement precision is improved, but existing methods fail to detect lead impurities below certain thresholds

Engineering Contradiction:
Improvedetection of lead impuritiesVSAvoiddetection limit of lead impurities
Core Design Contradiction:
Measurement precisionVSDifficulty of detecting and measuring

Solution Approach 1:

The patent employs an intermediary approach by using alpha particle emission measurements as a proxy indicator for lead impurity concentration. Instead of directly detecting difficult-to-measure lead isotopes, the method measures the alpha particles emitted by lead decay products, which serves as an indirect but effective indicator of lead content at trace levels.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent replaces traditional direct detection methods with a radiometric measurement system. By substituting mechanical or chemical detection methods with alpha particle counting, the system achieves superior sensitivity and precision in detecting lead impurities at concentrations below the detection limits of conventional methods.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Reliability

If alpha particle emissions are monitored over time, then reliability of emission assessment is improved, but the time required to assess emission potential increases

Engineering Contradiction:
Improveaccuracy of emission assessmentVSAvoidtime to assess emission potential
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent applies preliminary action by performing refining or melting processes before the material is deployed in electronic devices. This preliminary disruption of secular equilibrium provides an immediate reduction in alpha particle emissions that can be assessed at the time of device manufacturing, eliminating the need for long-term monitoring to establish baseline emission levels.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method enables accurate assessment and prediction of maximum alpha particle emissions in metallic materials, even when impurities are below detection limits, ensuring reliable electronic component performance by identifying potential alpha particle emission levels.

Implementation Method 1

A sample of the material is treated to diffuse target decay isotopes within the sample

Methodology Applied
Scientific EffectDiffusion: Diffusion

Implementation Method 2

A metallic material is initially subjected to a secular equilibrium disruption process, such as melting and/or refining

Methodology Applied
Scientific EffectMelting: Melting

Implementation Method 3

A metallic material is initially subjected to a secular equilibrium disruption process, such as melting and/or refining

Methodology Applied
Scientific EffectRefining: Purification

Implementation Method 4

detecting alpha particle emissions from a sample of the metallic material

Methodology Applied
Scientific EffectAlpha particle emission: Radioactive Decay

Data Source

PatentUS9194961B2Method for assessing an alpha particle emission potential of a metallic material
Publication Date: 2015.11.24 SOLSTICE ADVANCED MATERIALS US INC
  • US9194961B2 patent drawing
  • US9194961B2 patent drawing
  • US9194961B2 patent drawing

AI summary

A method for assessing an alpha particle emission potential of a metallic material. A metallic material is initially subjected to a secular equilibrium disruption process, such as melting and/or refining, to disrupt the secular equilibrium of the radioactive decay of one or more target parent isotopes in the material. A sample of the material is treated to diffuse target decay isotopes within the sample such that the measured alpha particle emission directly corresponds to the concentration or number of target decay isotope atoms within the entirety of the sample, enabling the concentration of target decay isotopes in the sample to be determined. The concentration of target parent isotopes in the material may then be determined from the concentration of target decay isotopes and time elapsed from the secular equilibrium disruption process, and may be used to determine a maximum alpha particle emission that the metallic material will exhibit.