Alt-Standard Cell Layout for Dense Semiconductor Block Integration

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Solution Overview

Problem

Existing semiconductor design systems face challenges in efficiently integrating circuit blocks with diverse characteristics into semiconductor devices, as they lack the ability to accommodate varying functional requirements and integration locations, leading to inefficiencies in design time and integration density.

Innovation Solution

A semiconductor design system that includes a design information medium, cell library, and design tool, which categorizes standard cells into alt-standard cells based on specific device types and integration locations, allowing for the selection and layout of cells that closely match the target circuit block's characteristics, with a correction module to adjust layouts within tolerance for optimal integration.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If standard cells are stored in a standard library without categorization, then the device complexity is reduced, but the adaptability to different device types and integration locations deteriorates

Engineering Contradiction:
Improveadaptability to different device types and integration locationsVSAvoidcomplexity of standard cell management
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent segments standard cells into multiple categories (first category for first device type, second category for second device type) and further divides them into alt-standard cells based on integration locations. This segmentation enables the system to handle diverse device types and integration requirements without creating a single complex unified structure, thus improving adaptability while managing complexity through organized classification.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies local quality by creating different alt-standard cells with specific layout patterns tailored to different integration locations within the same device type. Each alt-standard cell is optimized for its specific location requirements, allowing the system to accommodate varying local constraints while maintaining overall system manageability through the hierarchical classification structure.

Inventive Principle:
Principle #3Local quality

2Manufacturing precision

If a single standard cell layout is used for all circuit blocks, then the ease of manufacture is improved, but the manufacturing precision for different integration locations deteriorates

Engineering Contradiction:
Improveprecision of circuit block integrationVSAvoidease of standard cell selection and layout
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent introduces dynamic selection capability where the design tool automatically selects appropriate alt-standard cells based on the specific integration location and device type requirements. This dynamic adaptation allows the system to maintain high manufacturing precision for different locations while simplifying the user's task through automated selection, thus resolving the contradiction between precision and ease of manufacture.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the parameters of standard cell selection by introducing category-based filtering and alt-standard cell differentiation based on integration location characteristics. This parameterization allows precise matching of circuit blocks to their optimal layouts while maintaining ease of manufacture through systematic classification and automated selection mechanisms.

Inventive Principle:
Principle #35Parameter changes

3Productivity

If detailed configuration of each circuit block is manually determined, then the manufacturing precision is improved, but the design time deteriorates

Engineering Contradiction:
Improvedesign time efficiencyVSAvoidaccuracy of circuit block configuration
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent implements self-service through automated configuration where the design tool automatically determines the detailed configuration of circuit blocks by selecting appropriate alt-standard cells based on pre-stored design information. The system serves itself by automatically matching circuit block requirements with suitable layouts, eliminating manual configuration tasks while maintaining high precision through automated decision-making based on comprehensive design data.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent applies preliminary action by pre-categorizing standard cells into different categories and creating multiple alt-standard cells with different layout patterns before the actual design process. This preliminary organization allows the design tool to quickly and accurately configure circuit blocks during design time, significantly reducing the time required while maintaining manufacturing precision through pre-prepared, pre-validated layout options.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS20250371240A1Semiconductor design system and method of designing a semiconductor device using the same
Publication Date: 2025.12.04 SK HYNIX INC
  • US20250371240A1 patent drawing
  • US20250371240A1 patent drawing
  • US20250371240A1 patent drawing

AI summary

A semiconductor design system and a method for designing a semiconductor device using the system include a design tool configured to: determine a target circuit block to designed; select a standard cell configured to perform a function of the target circuit block; determine a detailed configuration of the target circuit block according to a power characteristic and an input/output characteristic of the target circuit block; based on circuit block information including the detailed configuration of the target circuit block, a device type to which the target circuit block is applied, and an integration location for the target circuit block, select an alt-standard cell among a plurality of alt-standard cells associated with the selected standard cell, for which the alt-standard cell has circuit block information that most closely matches the circuit block information for the target circuit block; and lay out the target circuit block by loading the selected alt-standard cell.