AM-OEL Pixel Pre-Formation Testing via Integrated Capacitors
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Solution Overview
Problem
Conventional methods for testing the performance of active matrix organic electroluminescent display (AM-OEL) pixel circuits are hindered as they can only be tested after forming the organic functional layer, making it difficult to control yields and cycle time.
Innovation Solution
A testing method and system that includes a substrate with a pixel circuit, pixel electrodes, testing components like capacitors, and a conductive layer, allowing for the measurement of signals and functionality of the pixel circuit before forming the organic functional layer by coupling testing components to the pixel circuit and activating/deactivating it in the absence of the organic layer.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If testing is performed after forming the organic functional layer, then the pixel circuit can be tested, but the yield and cycle time are difficult to control
Solution Approach 1:
The patent applies preliminary action by forming testing components (such as test capacitors or test resistors) and test circuits before forming the organic functional layer. This allows the pixel circuit to be tested at an early stage of the manufacturing process, enabling yield control before the time-consuming organic layer formation. The test components are integrated into the pixel circuit structure, allowing measurement of electrical characteristics like charge, voltage, and current without requiring the organic functional layer to be formed first.
2Productivity
If testing components are added to the pixel circuit, then pre-formation testing is enabled, but the device complexity increases
Solution Approach 1:
The patent merges the testing components with the existing pixel circuit structure. The test capacitors, test resistors, or test circuits are integrated into the same substrate and formed using the same fabrication processes. This merging approach allows pre-formation testing to be enabled while minimizing the increase in device complexity, as the test components share the same structural and manufacturing framework as the main pixel circuit.
Solution Approach 2:
The testing components are designed to serve multiple functions: they enable pre-formation testing of the pixel circuit, provide reference values for yield control, and can be used for process monitoring during manufacturing. This multi-functionality justifies the addition of testing components, as they provide valuable process control capabilities beyond simple testing.
Data Source
AI summary
A pixel testing method is provided. The pixel testing method is adapted to measure device parameters within each pixel of a display. Before plating a lighting device into each pixel, a capacitor is formed such that one end of the capacitor is connected to an open-circuit terminal of an electronic device while the other end of the capacitor is connected to an added common line (or the original scan line or data line of the display). The parameters of the electronic device connected to the lighting device are tested through a charging/discharging of the capacitor so that all the devices within a pixel can be tested before forming organic functional layer in every pixel.