AMOLED Pixel Calibration Using Coarse-Fine Pattern Imaging

The calibration pattern is segmented into two distinct levels: coarse features (spaced pattern of larger elements) and fine features (spaced pattern of smaller elements). The coarse features provide a low-resolution framework for initial pixel location estimation, while the fine features embedded within each coarse feature provide high-resolution refinement. This segmentation allows the system to achieve high measurement precision without overwhelming complexity in a single monolithic pattern.

The calibration approach transitions from attempting to directly measure all pixel locations in a single high-resolution step to a two-dimensional hierarchical approach. First, coarse features establish a low-resolution mapping framework across the entire panel. Then, fine features provide localized high-resolution corrections within each coarse feature region. This dimensional decomposition makes calibration of high-resolution displays feasible by breaking down the complex measurement task into manageable stages.

The calibration pattern implements local quality by concentrating fine features within localized regions defined by coarse features. Each coarse feature acts as a boundary container that encloses a specific set of fine features. This local concentration ensures that fine features remain densely packed and easily distinguishable within their local contexts, while the coarse features provide overall spatial coverage and structural framework across the entire calibration pattern area.