AMOLED Pixel Compensation via Grouped Row Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Large-sized AMOLED displays face challenges in brightness uniformity due to the immaturity of electrical compensation techniques, leading to significant errors in brightness compensation when TFT characteristics change before a new I-V model is established.
Innovation Solution
An organic light emitting diode pixel compensation method that involves testing drive transistors in specific rows to obtain test information, calculating a compensation parameter based on this information, and applying it to adjacent rows to compensate for brightness, thereby reducing data detection time and compensation errors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If external compensation method is used with row-by-row scanning and original I-V model, then device complexity is reduced, but measurement precision deteriorates due to significant errors when TFT characteristics change
Solution Approach 1:
The display panel rows are divided into multiple groups, with each group containing multiple rows. Instead of compensating row-by-row sequentially, the method tests drive transistors in one row and applies the compensation parameters to multiple rows within the same group, segmenting the compensation process into group-based operations that reduce detection time while maintaining precision.
Solution Approach 2:
The method performs preliminary testing of drive transistors to obtain test information before actual display operation. By pre-calculating compensation parameters based on TFT characteristics (threshold voltage and mobility) and applying them in advance to multiple rows, the system eliminates delays associated with real-time row-by-row compensation.
2Measurement precision
If row-by-row testing and compensation is performed, then measurement coverage is improved, but loss of time increases due to long update period of compensation parameters
Solution Approach 1:
The method merges the compensation process across multiple rows by testing drive transistors in one row and applying the same compensation parameters to multiple other rows within a group. This combining approach significantly reduces the total time required for compensation parameter updates while maintaining measurement accuracy through selective testing.
Solution Approach 2:
Instead of testing every row individually (excessive action), the method performs partial testing on selected rows and extrapolates compensation parameters to other rows in the group. This partial action approach reduces the time loss associated with comprehensive row-by-row testing while maintaining sufficient compensation accuracy.
Data Source
AI summary
An organic light emitting diode pixel compensation method, an organic light emitting diode pixel compensation device and a display device are provided. The organic light emitting diode pixel compensation method includes: testing drive transistors of sub-pixels in an Nth row to obtain first test information; testing drive transistors of sub-pixels in an Mth row to obtain second test information; calculating a compensation parameter based on the first test information and the second test information; and compensating the sub-pixels in the Nth row, the sub-pixels in the Mth row and the sub-pixels in a rows adjacent to the Nth row and the Mth row based on the compensation parameter, where N=an+b, M=an+c, a≥2, 0≤b<a, 0≤c<a, and a, b, c and n are each an integer.