AMOLED Line Defect Repair via Test Circuit Grafting

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Solution Overview

Problem

The existing repair methods for line defects in AMOLED display panels are inefficient, requiring additional layout space and additional requirements for the control IC, making them unsuitable for small size, high resolution panels.

Innovation Solution

A repair structure and method that integrates a repair circuit directly into the AMOLED display panel detecting circuit, using conductive films and repair lines that overlap and intersect with the existing test TFTs and signal lines, allowing for laser cutting and welding to repair defects without additional control IC requirements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of repair

If a repair circuit is added into the display panel, then line defect repair capability is improved, but layout space is occupied and control IC complexity increases

Engineering Contradiction:

Improveline defect repair capabilityVSAvoidlayout space

Core Design Contradiction:

Ease of repairVSArea of stationary object

Solution Approach 1:

The patent merges the repair circuit functionality with the existing detecting circuit by grafting the repair line onto the test line. The repair circuit shares the same physical layout space as the detecting circuit, eliminating the need for separate repair circuit space. This is achieved by making the repair line overlap with and be insulated from the test line, allowing both detection and repair functions to coexist in the same area.

Inventive Principle:

Principle #5Merging (Combining)

Solution Approach 2:

The test line is designed to serve dual purposes: it functions as a test line for detecting circuit operation and simultaneously serves as a repair line for defect repair. The conductive film structure allows the same physical pathway to be used for both detection signals and repair signals, making the circuit universal and eliminating the need for dedicated repair circuitry.

Inventive Principle:

Principle #6Universality (Multi-functionality)

2Ease of repair

If a repair circuit is added into the display panel, then line defect repair capability is improved, but control IC requirements increase

Engineering Contradiction:

Improveline defect repair capabilityVSAvoidcontrol IC requirements

Core Design Contradiction:

Ease of repairVSDevice complexity

Solution Approach 1:

The detecting circuit serves itself by using the same test line as a repair line. The existing test control terminal can directly control the repair operation without requiring additional control IC functionality. The repair circuit leverages the self-existing test control infrastructure, eliminating the need for external control IC modifications or additions.

Inventive Principle:

Principle #25Self-service

3Ease of repair

If conventional repair methods are used, then some defects can be repaired, but additional layout space and control IC requirements are created

Engineering Contradiction:

Improvedefect repair capabilityVSAvoidapplicability to small size high resolution panels

Core Design Contradiction:

Ease of repairVSAdaptability or versatility

Solution Approach 1:

The patent applies local quality by making the repair line overlap specifically with the test line in the detecting circuit area. The conductive film is positioned locally to cover the test TFT and connect the repair line to the test line, creating a localized repair mechanism that integrates seamlessly into the existing detecting circuit layout without affecting other areas of the display panel.

Inventive Principle:

Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for effective line defect repair within the existing layout, saving space and not requiring additional control IC functionality, making it applicable for small size, high resolution AMOLED display panels.

Implementation Method 1

a plurality of conductive films and a plurality of repair lines; an amount of the conductive films and an amount of the test TFTs are equipotent, and one conductive film correspondingly overlaps and covers above one test TFT and is insulated from the test TFT

Methodology Applied

Scientific EffectElectrical Conduction: Conduction (electrical)

Implementation Method 2

laser cutting portions of the signal line at two sides of a defect point

Methodology Applied

Scientific EffectLaser Ablation: Laser Ablation

Implementation Method 3

laser welding the source and the drain of the test TFT correspondingly coupled to the signal line, which appears the line defect, with the conductive film above the test TFT

Methodology Applied

Scientific EffectLaser Welding: Laser Beam Welding

Data Source

PatentUS10109688B2Repair structure of line defect of AMOLED display panel and repair method

Publication Date: 2018.10.23 TCL CHINA STAR OPTOELECTRONICS TECHNOLOGY CO LTD

AI summary

The present invention provides a repair structure of a line defect of an AMOLED display panel and a repair method. The conductive film (410) correspondingly overlaps and covers above the test TFT (310) and is insulated from the test TFT (310), and the repair line (420) is insulated and crossed with all the signal fanout lines (200) and the corresponding test line (330). It is realized that the repair line is directly grafted on the AMOLED display panel detecting circuit, which can utilize the present detecting circuit layout of the AMOLED display panel capable of introducing the repair line for having the repair function and saving the layout space, and has no additional requirement to the control IC, and particularly, can be applicable for the line defect repair of the small size, high resolution AMOLED display panel.