Amorphous Particle Thin Film for Interference-Suppressed Optical Patterns
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Solution Overview
Problem
The manufacturing of optical elements with complex micro/nanostructures for structural colors and functions like iridescence, non-iridescence, and polarization is challenging, requiring simpler and more efficient processes.
Innovation Solution
A thin film with an amorphous array of particles, featuring optically flat first regions and rougher second regions, is produced by depositing ink particles on a liquid-absorbent substrate, where the liquid is drawn into the substrate, and the top surface is modified to suppress thin film interference, using techniques like PDMS lithography.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If complex micro/nanostructures are manufactured to achieve structural colors and optical functions, then optical properties like iridescence and polarization are improved, but manufacturing complexity and difficulty increase
Solution Approach 1:
The patent changes the manufacturing parameters by using inkjet printing technology to deposit ink compositions containing particles on substrates. By controlling parameters such as particle size (50-500 nm), ink concentration, and printing patterns, the method achieves complex optical structures through simpler parameter control rather than complex structural fabrication
Solution Approach 2:
The patent replaces traditional mechanical lithography and complex microfabrication processes with inkjet printing technology. This substitution uses digital printing methods to directly form particle patterns on substrates, eliminating the need for complex mechanical lithography tools and multiple fabrication steps
2Manufacturing precision
If traditional lithography methods are used to create optical patterns, then manufacturing precision is maintained, but ease of manufacture decreases due to process complexity
Solution Approach 1:
The patent uses inkjet printing to create direct digital copies of desired optical patterns on substrates. The printing system can replicate complex patterns by digitally controlling ink deposition, eliminating the need for physical lithography masks and complex alignment procedures while maintaining pattern precision
Solution Approach 2:
The patent changes the manufacturing approach by using inkjet printing parameters (droplet size, deposition frequency, ink formulation) to achieve pattern precision. This allows precise control over particle placement and pattern formation through digital parameter control rather than mechanical precision requirements
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The method enables the production of thin films with angle-independent colors and enhanced coherent scattering, suitable for anti-counterfeiting applications, offering improved manufacturing efficiency and optical properties.
Implementation Method 1
The method may include depositing the ink composition on a surface of the substrate, wherein the liquid may be separated from the ink particles by being drawn into the substrate
Implementation Method 2
the thin film exhibiting thin film interference (TFI) and further coherent scattering from the amorphous array of particles
Implementation Method 3
the thin film exhibiting thin film interference (TFI) and further coherent scattering from the amorphous array of particles
Data Source
AI summary
An aspect of the disclosure relates to a thin film including an amorphous array of particles including a top surface and a bottom surface opposing each other, the thin film exhibiting thin film interference and further coherent scattering from the amorphous array of particles, wherein the thin film may include first regions and second regions, wherein the thin film interference of the second regions may be suppressed as compared to the first regions. Another aspect of the disclosure relates to a product including an indicium including a thin film in accordance with any of the previous claims, wherein the indicium may include an encoded pattern encoded by the relative position of the second regions to the first regions, wherein the encoded pattern may be visible under specular reflection of light of a pre-determined wavelength. Another aspect of the disclosure relates to a method of producing a thin film.


