Amplifier Electrostatic Breakdown Prevention via Protection Diode

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Solution Overview

Problem

Miniaturization of amplifiers in potential measuring apparatuses leads to reduced input capacitance, increasing the risk of electrostatic breakdown during manufacturing.

Innovation Solution

Incorporating a protection diode connected to the amplifier and a reference potential generating unit on the same substrate, which bypasses negative charges during the electrode formation process, and using additional diodes with similar IV characteristics to stabilize the input voltage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Volume of moving object

If the amplifier is miniaturized to reduce apparatus size, then the apparatus is miniaturized, but the input capacitance is reduced leading to electrostatic breakdown risk

Engineering Contradiction:
Improveapparatus sizeVSAvoidelectrostatic breakdown risk
Core Design Contradiction:
Volume of moving objectVSReliability

Solution Approach 1:

A protection diode is introduced as an intermediary component between the electrode formation process and the amplifier. This diode provides a safe discharge path for negative charges generated during electrode formation, preventing them from reaching and damaging the miniaturized amplifier, thus resolving the contradiction between miniaturization and electrostatic protection

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The protection diode is configured to act in advance during the electrode formation process. By providing a pre-established discharge path before the amplifier can be damaged, the system proactively prevents electrostatic breakdown, allowing the amplifier to be miniaturized without compromising reliability

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Prevents electrostatic breakdown during manufacturing by effectively managing negative charges, ensuring the stability of the amplifier and reference potential generating unit.

Implementation Method 1

the protection portion bypasses generated negative charges to the amplifier via a wiring connected to the read electrode and the reference potential electrode at a time of an electrode formation process for forming the read electrode and the reference potential electrode to protect the amplifier

Methodology Applied
Scientific EffectElectrostatic discharge: Electrostatic Discharge

Implementation Method 2

the protection portion can be a protection diode of which a cathode is connected to a previous stage of the gate on the wiring for connecting the read electrode and the amplifying transistor, and an anode is grounded

Methodology Applied
Scientific EffectDiode reverse breakdown: Diode

Data Source

PatentUS10852292B2Semiconductor apparatus and potential measuring apparatus
Publication Date: 2020.12.01 SONY SEMICON SOLUTIONS CORP
  • US10852292B2 patent drawing
  • US10852292B2 patent drawing
  • US10852292B2 patent drawing

AI summary

The present disclosure relates to a semiconductor apparatus and a potential measuring apparatus capable of preventing electrostatic breakdown in an electrode formation process when an electrode and an amplifier are provided on a same substrate. A diode is provided of which a cathode is connected to a previous stage of an amplifying transistor for amplifying a signal read by a read electrode for reading a potential having contact with liquid in which a specimen is input and an anode is grounded. With such a configuration, by bypassing a negative charge generated between the electrode and the amplifying transistor in the electrode formation process from the diode and discharging the negative charge toward ground so as to prevent electrostatic breakdown. This is applicable to a bioelectric potential measuring apparatus.