Analog Circuit Device Migration via KPI Matching
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Solution Overview
Problem
The process of migrating analog designs from older to newer technologies is labor-intensive and time-consuming, especially when dealing with complex circuit designs, as existing methods fail to efficiently differentiate device functions and perform geometrical migrations effectively, leading to lengthy PDK studies and extensive engineering efforts.
Innovation Solution
A method involving tagging and categorizing source-PDK devices in a source-circuit design using hierarchical tags, generating simulation databases, matching target-PDK devices based on KPIs, and creating a migration mapping table to facilitate a one-to-one relationship between source and target devices, allowing for efficient migration of designs from older to newer technologies.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If existing methods are used for analog design migration, then device migration can be completed, but the process is labor-intensive and time-consuming
Solution Approach 1:
The patent segments the complex design migration process into distinct phases: characterization of source devices, extraction of geometric parameters, matching with target devices, and verification. This segmentation enables automated processing of each phase independently, significantly improving productivity while reducing overall migration time
Solution Approach 2:
The patent performs preliminary characterization of source devices and pre-extraction of geometric parameters before the actual migration process. By preparing device libraries and characterization data in advance, the system eliminates time-consuming manual analysis during migration, thereby improving efficiency and reducing migration time
2Productivity
If existing methods are used for device migration, then migration can be completed, but extensive engineering effort is required
Solution Approach 1:
The patent creates automated copying mechanisms that replicate device characteristics and geometric parameters from source to target technology nodes. By using standardized extraction templates and automated parameter mapping, the system reduces engineering complexity while maintaining high migration throughput
Solution Approach 2:
The patent systematically changes geometric parameters (width, length, area, perimeter) and electrical characteristics according to predefined scaling relationships between technology nodes. This parameter-based approach automates the migration process, reducing both engineering effort and complexity while improving productivity
3Measurement precision
If manual device differentiation is performed, then device functions can be identified, but the process is time-consuming
Solution Approach 1:
The patent replaces manual mechanical analysis with automated computational methods for device characterization. The system uses algorithmic extraction of geometric parameters and automated comparison with target device specifications, achieving precise device function identification instantaneously without time-consuming manual analysis
Solution Approach 2:
The patent introduces an intermediary characterization layer that automatically extracts and standardizes device parameters from source designs. This intermediary processing step enables precise device differentiation and matching with target devices, eliminating time-consuming manual analysis while maintaining high accuracy
Data Source
AI summary
A method includes tagging source PDK devices (SPDs) in a source-circuit design (SCD); generating a source design simulation database (SDSD) based on source design key performance indicator (KPI) simulation data of the SPDs in the SCD; generating a target process design kit (PDK) simulation database (TPSD) based on target design KPI simulation data of a plurality of target-PDK devices (TPDs); creating a matching table based on the SDSD and the TPSD; matching, based on the matching table, one or more TPDs from the TPSD with each SPD in the SDSD based on SPD KPIs; ranking the one or more TPDs matched from the TPSD with each SPD in the SDSD based on the SPD KPIs; and exchanging, based on a migration mapping table that includes a one-to-one relationship for TPDs to the SPDs in the SCD, one or more SPDs in the SCD with one-to-one relational TPDs.