Analog Current Source Switching for Individual Test Measurement
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current sources in analog circuits are difficult to identify as abnormal if their generated current deviates from the desired value, as external measurement is challenging, and existing techniques can only detect abnormality in circuit blocks, not individual current sources.
Innovation Solution
A semiconductor integrated circuit design that includes a first node, a second node, a third node, a first analog circuit block, a plurality of first current sources, and a first switch group, allowing individual measurement of current by switching the electrical connection of each current source's second end to the second node in a test mode.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If current consumption measurement is performed for each circuit block using existing techniques, then abnormality detection capability is improved, but measurement precision for individual current sources deteriorates
Solution Approach 1:
The patent divides the measurement function into two levels: circuit block level (for abnormality detection) and current source level (for precise measurement). The switching circuit enables segmentation of measurement targets, allowing individual current sources to be measured separately by switching connections to the measurement terminal, thereby achieving both block-level reliability and source-level precision.
2Measurement precision
If individual current source measurement is implemented, then measurement precision is improved, but device complexity worsens
Solution Approach 1:
The measurement terminal and switching circuit serve multiple functions: they enable both circuit block-level measurement and individual current source measurement. The same measurement terminal can measure different targets by switching connections, eliminating the need for separate measurement circuits for each current source and reducing overall device complexity.
Solution Approach 2:
The switching circuit acts as an intermediary between the current sources and the measurement terminal. It controls the connection state between current sources and the measurement terminal, enabling flexible measurement of individual current sources or circuit blocks without requiring direct separate connections for each measurement target.
3Ease of operation
If switching connection for individual current source measurement is added, then ease of operation is improved, but device complexity worsens
Solution Approach 1:
The measurement terminal is designed to serve multiple measurement purposes through switching connections. It can measure individual current sources or entire circuit blocks by changing connection states, providing ease of operation for different measurement needs while using a single unified measurement interface rather than multiple dedicated terminals.
Data Source
AI summary
In a semiconductor integrated circuit, a first analog circuit block operates by a voltage applied between a first node and a third node. Each of a plurality of first current sources has a first end connected to the third node and a second end connected to the first analog circuit block. The plurality of first current sources function as current sourcing or current sinking for the first analog circuit block. A first switch group is provided between the plurality of first current sources and the first analog circuit block, and in a test mode, individually switches electrical connection of the second end of each of the plurality of first current sources from the first analog circuit block to a second node.