Analog Defect Weight Formulas for Simulation Accuracy
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Solution Overview
Problem
Current analog defect simulation methods lack a systematic approach to determining accurate defect weight formulas, leading to inadequate representation of analog components and circuits, particularly in mixed signal electronic devices, where analog components are prone to failures affecting the reliability of advanced technologies like advanced driver-assist systems.
Innovation Solution
The proposed solution involves an electronic design platform that systematically groups defects into unique classes based on modeling parameters, generating defect weight formulas for these classes to simulate defects such as stuck-on, stuck-off, open circuit, and short circuit faults, using a combination of software applications and simulation algorithms to model and analyze analog circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional analog defect simulation methods are used, then the simulation process is simpler, but the accuracy of defect weight calculation is insufficient
Solution Approach 1:
The patent segments defects into unique classes based on modeling parameters such as defect type, location, and electrical characteristics. This segmentation allows for more precise defect weight calculation by treating different defect categories separately, thereby improving measurement precision without overwhelming system complexity through manageable classification groups.
Solution Approach 2:
The patent introduces multiple modeling parameters to characterize defects including defect type, location, size, and electrical properties. By changing and utilizing these parameters systematically, the defect weight calculation accuracy is improved while the complexity is managed through structured parameter organization and classification.
2Reliability
If more comprehensive defect modeling parameters are used, then the representation of analog components is more accurate, but the complexity of defect simulation increases
Solution Approach 1:
By segmenting defects into unique classes based on comprehensive modeling parameters, the patent achieves better reliability in representing analog component failures while managing simulation complexity through organized classification. Each defect class can be simulated with appropriate detail level, balancing accuracy and complexity.
Solution Approach 2:
The patent creates a universal defect simulation framework that handles multiple defect types and modeling parameters through a unified approach. This multi-functionality allows comprehensive defect representation while avoiding the need for separate complex simulation systems for each defect type, thereby improving reliability without proportionally increasing overall complexity.
3Productivity
If defect classes are grouped by modeling parameters, then manufacturing test coverage improves, but the time required for defect analysis increases
Solution Approach 1:
By segmenting defects into unique classes based on modeling parameters, the patent improves manufacturing test coverage through more targeted and accurate defect detection. The segmented classification allows test vectors to be optimized for specific defect types, improving productivity while the structured grouping keeps analysis time manageable through systematic organization.
Data Source
AI summary
A method, apparatus, and/or computer program product can perform an analog defect simulation on an electronic device. The method, apparatus, and/or computer program product can generate a defect catalog which identifies a defect class relating to a defect and a modeling parameter that is associated with the defect class. The method, apparatus, and/or computer program product can receive a weight formula that identifies a weight for the defect class in relation to the modeling parameter. The method, apparatus, and/or computer program product can call a defect weight function to return the weight from the defect weight formula. The method, apparatus, and/or computer program product can perform the analog defect simulation on the electronic device. The method, apparatus, and/or computer program product can determine a simulation statistic relating to the analog defect simulation utilizing the weight.