Analysis Assistance Display for Measurement Quality Distributions

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Solution Overview

Problem

Existing analysis devices lack the ability to provide detailed and meaningful information about the relationship between analysis conditions and measurement quality indicators, making it difficult for users to efficiently evaluate and ensure the quality of measurement results.

Innovation Solution

An analysis assistance device and method that utilizes a design space to visually depict the relationship between analysis factors and responses, allowing for the estimation and display of measurement quality indicator distributions using regression analysis, enabling users to compare and examine the ranges of factors that ensure measurement quality.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of information

If a design space is displayed showing the distribution of measurement quality indicators, then users can visually understand the relationship between factors and responses, but the information provided may lack meaningful detail for efficient evaluation

Engineering Contradiction:
Improveinformation about measurement quality distributionVSAvoidefficiency of quality evaluation
Core Design Contradiction:
Loss of informationVSEase of operation

Solution Approach 1:

The design space is segmented into multiple regions based on measurement quality indicator thresholds. The display is divided into a first region showing the overall distribution and a second region providing enlarged detailed views of specific areas, allowing users to examine both global patterns and local details efficiently

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent adds a spatial dimension to the display by creating an enlarged view of a specific region within the design space. This transforms a two-dimensional distribution map into a multi-level hierarchical display, enabling users to zoom into areas of interest while maintaining context of the overall distribution

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Loss of information

If the design space displays the entire distribution region, then complete information is provided, but detailed examination of specific quality regions becomes difficult

Engineering Contradiction:
Improvecompleteness of distribution informationVSAvoiddetail of quality indicator examination
Core Design Contradiction:
Loss of informationVSMeasurement precision

Solution Approach 1:

The display is segmented into a first display region showing the complete design space distribution and a second display region showing an enlarged view of a specific sub-region. This segmentation allows simultaneous presentation of both comprehensive and detailed information without loss of either completeness or precision

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements a nested display structure where the second enlarged display region is embedded within or alongside the first overall display region. This nesting allows users to view the detailed enlarged region while maintaining awareness of its position within the complete distribution space

Inventive Principle:
Principle #7Nested doll (Nesting)

3Measurement precision

If the design space is enlarged to show detailed regions, then measurement quality details become visible, but regions outside the design space are cut off

Engineering Contradiction:
Improvedetail of measurement quality indicatorVSAvoidvisible distribution region
Core Design Contradiction:
Measurement precisionVSArea of stationary object

Solution Approach 1:

The patent introduces a reference indication (such as a marker or boundary indicator) that serves as an intermediary between the enlarged detailed view and the overall design space context. This reference shows the position and extent of the enlarged region relative to the complete distribution, allowing users to understand what areas are visible and what lies outside

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentEP4293353B1Analysis assistance device, analysis assistance method and analysis assistance program
Publication Date: 2026.03.25 SHIMADZU CORP
  • EP4293353B1 patent drawingFigure 1
  • EP4293353B1 patent drawingFigure 2
  • EP4293353B1 patent drawingFigure 3

AI summary

An analysis assistance device includes an estimator that estimates a distribution of measurement quality indicator data by performing a regression analysis with use of a plurality of analysis condition data pieces supplied to an analysis device and a plurality of measurement data pieces obtained by the analysis device based on the plurality of analysis condition data pieces, and an analysis assistance information outputter that outputs a distribution of the measurement quality indicator data to a display device. The analysis condition data pieces include a first factor. The estimator estimates respective distributions of the measurement quality indicator data in a case in which the first factor is a first value and a case in which the first factor is a second value. The analysis assistance information outputter outputs the respective distributions to the display device.