Automatic Analyzer Abnormality Detection via Absorbance Feature Parameters
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional automatic analyzers face challenges in identifying specific abnormalities in reaction process data, requiring labor-intensive examination by technicians to determine the cause of abnormalities, which hinders efficient device maintenance and reliability.
Innovation Solution
An automated system that computes feature parameters and occurrence frequencies of absorbance changes in reaction process data to assist in abnormality detection, allowing for quicker identification of device issues and improved maintenance through data analysis and visualization tools.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional abnormality detection methods are used, then abnormality detection is performed, but labor-intensive examination by technicians is required and time is consumed
Solution Approach 1:
The patent segments the examination process by dividing abnormal reaction process data into multiple types (device abnormalities, sample abnormalities, reagent abnormalities, other abnormalities) with specific detection indicators for each type. This segmentation enables targeted analysis rather than exhaustive item-by-item examination, significantly reducing the time required while maintaining detection reliability.
Solution Approach 2:
The patent introduces an intermediary classification system that categorizes abnormalities based on detection indicators (e.g., reaction rate, absorbance change patterns, linearity metrics). This intermediary classification enables automated or semi-automated identification of abnormality types, reducing the need for manual technician examination while preserving accurate abnormality detection.
2Reliability
If comprehensive abnormality detection is performed, then all types of abnormalities can be identified, but the complexity of analysis increases
Solution Approach 1:
The patent reduces analysis complexity by segmenting comprehensive abnormality detection into distinct categories (device, sample, reagent, other abnormalities), each with specific detection indicators. This segmentation transforms a complex unified analysis problem into multiple simpler, targeted analysis tasks that can be processed more efficiently.
Solution Approach 2:
The patent applies local quality by assigning specific detection indicators to different abnormality types (e.g., reaction rate for device abnormalities, linearity metrics for sample abnormalities). This allows each aspect of the analysis to focus on relevant parameters only, reducing overall complexity while maintaining comprehensive detection capability.
3Ease of operation
If feature parameters of absorbance changes are computed, then abnormality identification is facilitated, but additional data processing is required
Solution Approach 1:
The patent extracts key feature parameters (reaction rate, absorbance change patterns, linearity metrics) from the raw reaction process data. By taking out only the essential features needed for abnormality identification rather than analyzing all raw data, the system facilitates easier abnormality identification while keeping additional processing requirements minimal and targeted.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Facilitates faster detection of abnormalities, enhances device maintenance efficiency, and improves reliability without adding new hardware, by quantifying and visualizing absorbance changes and their frequencies, aiding laboratory technicians in pinpointing issues.
Implementation Method 1
measures the absorbance of this mixture, calculates the amount of change in absorbance and/or the rate of change in absorbance based on time series data of absorbance caused by the chemical reaction
Data Source
Figure 1~2
Figure 3
Figure 4~5
AI summary
In the event of a suspected abnormality in the device, sample or reagent, a laboratory technician had to examine the abnormal reaction process data item by item, and infer the cause of the abnormality, which took effort and time in some cases. Abnormality judgment is assisted using: indicator computation means that computes an indicator indicating a feature parameter of a given waveform by applying a pre-defined evaluation formula to time series data of photometric values; relative indicator computation means that computes a value indicating a relationship of the indicator of target data to the indicator computed in the past; and indicator display means that simultaneously displays a value computed by the indicator computation means and the value computed by the relative indicator computation means. According to the present method, which is a method for assisting judgment of abnormality wherein a feature parameter of a given absorbance change is computed, it can be made easier to find certain abnormalities, and it becomes possible to attain more efficient device maintenance and improved device reliability without the addition of any new parts.