Unified Screen for Automatic Analyzer Defect Investigation

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Solution Overview

Problem

Existing automatic analyzers face difficulties in efficiently investigating and analyzing defects in specimen measurement results due to scattered and uncoordinated information display, leading to complex and inaccurate data interpretation, requiring expertise and significant time, which hinders clinical examination processes.

Innovation Solution

An automatic analyzer with an analysis unit, storage unit, display unit, and control unit that chronologically displays and filters analysis parameters, reagent information, and quality control information on a unified screen, improving searchability and visibility of defect-related information.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of information

If various types of information (analysis parameters, reagent information, calibration results, quality control information) are displayed separately on different screens, then each piece of information can be displayed in detail, but the time and effort required to search and collect defect-related information increases significantly

Engineering Contradiction:
Improvevisibility of defect-related informationVSAvoidtime required for investigating defects
Core Design Contradiction:
Loss of informationVSLoss of time

Solution Approach 1:

The patent merges multiple types of information (analysis parameters, reagent information, calibration results, quality control information) that were previously displayed on separate screens into a single unified screen. This integration allows operators to view all defect-related information in one place, eliminating the need to navigate between multiple screens and significantly reducing the time required to search and collect information for defect investigation.

Inventive Principle:
Principle #5Merging (Combining)

2Reliability

If information is displayed separately across multiple screens, then each information type can be presented comprehensively, but the complexity of information search and analysis increases

Engineering Contradiction:
Improveaccuracy of data interpretationVSAvoidcomplexity of information search process
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

By combining all defect-related information types into a single unified screen, the patent reduces the complexity of the information search process. Operators no longer need to switch between multiple screens or remember which information is located where, thereby reducing analytical complexity and minimizing the risk of misinterpretation while maintaining comprehensive information presentation.

Inventive Principle:
Principle #5Merging (Combining)

3Loss of information

If detailed information on analysis parameters, reagent information, calibration results, and quality control information is provided separately, then completeness of information is maintained, but the operability and maintenance of the automatic analyzer decreases

Engineering Contradiction:
Improvecompleteness of defect informationVSAvoidoperability during defect investigation
Core Design Contradiction:
Loss of informationVSEase of operation

Solution Approach 1:

The unified screen integrates all defect-related information types (analysis parameters, reagent information, calibration results, quality control information) into a single view, maintaining the completeness of information while dramatically improving operability. Operators can now access and analyze all necessary defect information without navigating through multiple screens, making the defect investigation process more efficient and user-friendly.

Inventive Principle:
Principle #5Merging (Combining)

4Productivity

If multiple types of information are displayed on a single unified screen, then the time and effort for defect investigation is reduced, but the screen complexity and information density increases

Engineering Contradiction:
Improveefficiency of defect analysisVSAvoidscreen information density
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

While displaying all defect-related information on a single unified screen, the patent employs segmentation by organizing information into distinct sections or categories (analysis parameters, reagent information, calibration results, quality control information). This segmentation allows the screen to present high-density information in an structured, readable format that maintains productivity benefits while reducing the perceived complexity for operators.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentEP3267202B1Automatic analysis device
Publication Date: 2022.01.26 HITACHI HIGH TECH CORP
  • EP3267202B1 patent drawingFigure 1
  • EP3267202B1 patent drawingFigure 2
  • EP3267202B1 patent drawingFigure 3

AI summary

Included are an analysis unit that performs an analysis process for analyzing a specimen to be analyzed, a storage unit that stores a result of the analysis process, cumulative information on an occurrence of an event such as registration, change or deletion of analysis parameters such as analysis conditions in the analysis process, and cumulative information on an occurrence of an event such as registration, deletion or replacement of reagent information which is information on a reagent used for analysis of the specimen, for each analysis item of the specimen, and a display unit that displays the analysis result of the specimen and information on an occurrence status of the event. An operation of the analysis process of the specimen by the analysis unit is controlled, and the information on the event of the analysis parameter and the information on the event of the reagent information is read from the storage unit and displayed on the display unit in chronological order. Thus, it is possible to shorten the time required for investigating and analyzing defects and improve reliability, by improving the searchability and visibility of various types of information relating to investigation of defect in the case where some defect such as data abnormality occurs in a specimen measurement result.