Automatic Analyzer Specimen Rack Segmentation for Rapid Reanalysis

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Solution Overview

Problem

Automatic analyzers face inefficiencies when specimen ID reading errors or sample shortages occur, leading to incomplete analysis and the need for specimens to be reloaded, causing delays in obtaining measurement results.

Innovation Solution

An automatic analyzer system with a control mechanism that allows for the specification and collection of specimen racks holding failed or insufficient samples, enabling reanalysis without waiting for other specimens on the same rack to complete processing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the device extracts the failed sample unconditionally to the rack extraction port, then the failed sample can be identified and isolated, but the process for other samples on the same rack is suspended and measurement time is extended

Engineering Contradiction:
Improvefailed sample identificationVSAvoidmeasurement throughput
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The invention segments the rack into individual sample vessels, allowing the control mechanism to identify and extract only the specific failed sample vessel rather than the entire rack. This enables other samples on the same rack to continue processing independently, resolving the contradiction between reliable failed sample identification and maintaining measurement throughput.

Inventive Principle:
Principle #1Segmentation

2Productivity

If the automatic analyzer carries on measurements with racks containing unread ID information, then measurement productivity is maintained, but the specimen with unread ID cannot be measured and requires reloading after rack collection

Engineering Contradiction:
Improvemeasurement throughputVSAvoidreloading time
Core Design Contradiction:
ProductivityVSLoss of time

Solution Approach 1:

The control mechanism performs preliminary identification of samples with unread ID information before the measurement process begins. By detecting this condition in advance, the system can suspend the rack collection process and allow the failed sample to be reloaded and re-measured without delaying other samples, thereby reducing reloading time while maintaining productivity.

Inventive Principle:
Principle #10Preliminary action

3Reliability

If the specimen needs to be reloaded due to reading error or sample shortage, then the measurement can be corrected, but the specimen processing time is extended and efficiency is reduced

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidspecimen processing time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The control mechanism continuously monitors the measurement process and provides feedback when a sample is identified as failed or incomplete. This feedback enables the system to automatically suspend the current rack collection, notify the operator, and allow for immediate reloading of the specific sample vessel. The feedback loop ensures measurement accuracy is maintained while minimizing processing time by enabling rapid correction without waiting for other samples to complete.

Inventive Principle:
Principle #23Feedback

Data Source

PatentEP2423689B1Automatic analysis device
Publication Date: 2019.01.30 HITACHI HIGH TECH CORP
  • EP2423689B1 patent drawingFigure 1
  • EP2423689B1 patent drawingFigure 2
  • EP2423689B1 patent drawingFigure 3

AI summary

The present invention provides an automatic analyzer, in which when a specimen that cannot be analyzed due to an abnormality or needs to be remeasured exists, the automatic analyzer can swiftly reload the specimen that cannot be analyzed due to the abnormality or needs to be remeasured without waiting for completion of a measurement of another specimen held by a rack holding the specimen that cannot be analyzed or needs to be remeasured. The automatic analyzer has means for storing information of a rack loaded in the analyzer and specimen information, displaying identification information of the rack loaded in the analyzer to a user, specifying a specimen that needs to be reanalyzed due to an abnormality or needs to be collected for a remeasurement, interrupting analysis of a specimen rack holding the specimen, and collecting the specimen rack. The automatic analyzer can collect and reload the specified specimen.