Angular Offset X-Ray Source Sampling Resolution

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Solution Overview

Problem

X-ray imaging systems with point-source technology face limitations in signal-to-noise ratio and image fidelity, particularly when reconstructing multiple image planes, due to variations in spatial resolution and ray convergence, which affect the quality of reconstructed images.

Innovation Solution

An X-ray imaging system with a radiation source having rows of discrete emissive locations that are angularly offset relative to rows of sensing elements on a radiation sensor, allowing for improved sampling resolution by altering the geometry of ray intersections and using a processor to allocate and map sensor responses into an image plane, thereby enhancing image fidelity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a point-source X-ray imaging system is used, then image resolution and imaging speed are improved, but signal-to-noise ratio deteriorates

Engineering Contradiction:
Improveimage resolutionVSAvoidsignal-to-noise ratio
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The X-ray source is divided into multiple discrete emissive locations (array of focal spots) rather than using a single point source. This segmentation allows simultaneous acquisition of multiple projection views, improving signal-to-noise ratio through increased photon statistics while maintaining image resolution through appropriate detector geometry and reconstruction algorithms

Inventive Principle:
Principle #1Segmentation

2Productivity

If a point-source X-ray imaging system is used, then imaging speed is improved, but the ability to reconstruct multiple image planes deteriorates

Engineering Contradiction:
Improveimaging speedVSAvoidmulti-plane reconstruction capability
Core Design Contradiction:
ProductivityVSAdaptability or versatility

Solution Approach 1:

The system transitions from 2D point-source imaging to 3D volumetric imaging by using an array of discrete emissive locations that sample different spatial positions and angles. This enables reconstruction of multiple image planes at different depths along the z-axis, providing three-dimensional information while maintaining imaging speed through simultaneous multi-point emission

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Reliability

If discrete emissive locations are used to improve multi-plane reconstruction, then signal-to-noise ratio is improved, but spatial resolution varies from plane to plane

Engineering Contradiction:
Improvesignal-to-noise ratioVSAvoidspatial resolution
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The system applies local quality optimization by using discrete emissive locations that are strategically positioned and angularly offset to provide optimal sampling density at different depths. The angular offset creates varying ray intersection patterns that improve sampling resolution specifically in regions where it deteriorates, while maintaining high signal-to-noise ratio through the collective contribution of multiple source points

Inventive Principle:
Principle #3Local quality

4Measurement precision

If an angular offset is introduced between source and sensor, then sampling resolution is improved, but system complexity increases

Engineering Contradiction:
Improvesampling resolutionVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system introduces an angular offset parameter between the discrete emissive locations and the sensor array, which fundamentally changes the ray intersection geometry. This parameter change improves sampling resolution by creating more uniform spatial distribution of X-ray paths, while the complexity increase is managed through computational reconstruction algorithms that account for the angular geometry

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The angular offset between the source and sensor increases sampling resolution, reducing redundancy and improving image quality by ensuring more accurate representation of image pixels, even in areas with varying X-ray attenuation, thus enhancing the spatial resolution and fidelity of reconstructed images.

Implementation Method 1

X-ray imaging systems utilize sources having a plurality of discrete emissive locations

Methodology Applied
Scientific EffectX-ray emission: X-Ray

Implementation Method 2

a relatively small detector that detects the radiation

Methodology Applied
Scientific EffectX-ray detection: Photoelectric Effect

Data Source

PatentEP2943781B1Method and apparatus for improved sampling resolution in x-ray imaging systems
Publication Date: 2017.09.20 NOVARAY MEDICAL
  • EP2943781B1 patent drawingFigure 1
  • EP2943781B1 patent drawingFigure 2
  • EP2943781B1 patent drawingFigure 3

AI summary

The present invention pertains to an apparatus and method for X-ray imaging wherein a radiation source comprising rows of discrete emissive locations can be positioned such that these rows are angularly offset relative to rows of sensing elements on a radiation sensor. A processor can process and allocate responses of the sensing elements in appropriate memory locations given the angular offset between source and sensor. This manner of allocation can include allocating the responses into data rows associated with unique positions along a direction of columns of discrete emissive locations on the source. Mapping coefficients can be determined that map allocated responses into an image plane.