Annular Sensor Electron Beam Diagnostic System
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Solution Overview
Problem
Existing electron beam diagnostic systems face limitations in accurately measuring power density distribution due to secondary electron and ion transport issues and degradation of electrical contacts, particularly when dealing with non-circular beams and higher power applications.
Innovation Solution
The introduction of an annular sensor with a second slit disk, a ring, and an improved ground arrangement for the tungsten slit disk, along with a beam trap, allows for more accurate power density distribution measurements by enabling linear scanning and easier integration with a detached heat sink, enhancing the resolution and usability of electron beam diagnostics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a modified Faraday cup with tungsten slit disk is used to measure electron beam current density distribution, then measurement capability is provided, but secondary electrons and ions are transported back to the slit disk causing measurement errors and electrical contact degradation
Solution Approach 1:
The sensor is divided into multiple functionally independent components: the first slit disk for beam sampling, the second slit disk for preventing secondary particle transport, the annular sensor for current measurement, and the beam trap for capturing residual particles. This segmentation isolates the measurement function from the harmful secondary effects, resolving the contradiction between measurement capability and reliability.
Solution Approach 2:
The second slit disk acts as an intermediary barrier between the electron beam and the annular sensor, preventing secondary electrons and ions from reaching the sensor while allowing primary beam measurement. This intermediary component resolves the contradiction by blocking harmful transport paths without interfering with the primary measurement function.
2Measurement precision
If radial slits are used in the Faraday cup to create beam images, then current density distribution can be measured, but the system cannot properly orient non-circular beam profiles with respect to the welding chamber
Solution Approach 1:
The system transitions from measuring only radial beam profiles to capturing two-dimensional beam images by combining radial slit measurements with angular information. The computer tomography reconstruction process reconstructs full 2D beam profiles from multiple angular measurements, enabling proper orientation of non-circular beams with respect to the welding chamber while maintaining measurement precision.
3Measurement precision
If the electron beam is oscillated in a circular path around the tungsten slit disk, then the beam can be sampled at multiple angles, but the system becomes complex and difficult to integrate with detached heat sinks
Solution Approach 1:
The system separates the sampling function (first slit disk) from the measurement function (annular sensor), allowing independent optimization of each component. This segmentation simplifies integration with detached heat sinks while maintaining multi-angle sampling capability through the oscillating beam geometry.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution provides improved accuracy and reliability in measuring electron beam profiles, allowing for higher resolution and easier integration with existing CT software, and is more suitable for higher power applications, addressing the limitations of previous systems.
Implementation Method 1
an annular electron beam diagnostic sensor... As the beam crosses the sensor, the beam's current is intercepted, generating a current versus time profile
Implementation Method 2
The sampled beam current is then measured with an MFC (modified Faraday cup)
Data Source
AI summary
A system for analyzing an electron beam including a circular electron beam diagnostic sensor adapted to receive the electron beam, the circular electron beam diagnostic sensor having a central axis; an annular sensor structure operatively connected to the circular electron beam diagnostic sensor, wherein the sensor structure receives the electron beam; a system for sweeping the electron beam radially outward from the central axis of the circular electron beam diagnostic sensor to the annular sensor structure wherein the electron beam is intercepted by the annular sensor structure; and a device for measuring the electron beam that is intercepted by the annular sensor structure.