Antenna Array Beam Index Determination for 5G
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Solution Overview
Problem
The increasing number of beam indexes in 5G communication systems prolongs the time required for beam measurement operations, and movement of electronic devices further complicates the stability of beam measurement results.
Innovation Solution
The use of a combination of first and second antenna arrays, where the processor measures signal strengths for multiple beam indexes and selects the optimal beam index based on differences in signal strengths, reducing the time needed for beam index determination and accounting for device movement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the number of beam indexes is increased to improve beam measurement accuracy, then the measurement precision is improved, but the time required for beam measurement operation increases
Solution Approach 1:
The patent applies preliminary action by performing beam measurement operations in advance using multiple antenna arrays before the actual communication operation. The processor measures beam indexes and signal strengths using both the first and second antenna arrays beforehand, so that when communication is needed, the optimal beam index can be quickly selected without performing full measurements at that moment. This pre-measurement approach reduces the time required during actual operation while maintaining measurement accuracy across multiple beam indexes.
Solution Approach 2:
The patent merges the functionality of multiple antenna arrays (first antenna array and second antenna array) to perform beam measurements simultaneously or in coordinated fashion. By combining the measurement capabilities of both antenna arrays, the system can evaluate multiple beam indexes more efficiently, reducing the total time required while maintaining comprehensive measurement coverage for accurate beam selection.
2Measurement precision
If beam measurement operation is performed to determine optimal beam index, then the beam measurement accuracy is improved, but the reliability of beam measurement result decreases when the electronic device moves
Solution Approach 1:
The patent performs beam measurements using multiple antenna arrays in advance, before the device moves to a new position. By completing measurements with both the first and second antenna arrays beforehand, the system captures beam characteristics at the initial position. When the device moves, the system can compare these preliminary measurements with new measurements or select from pre-measured data, maintaining reliability by having baseline data for comparison and reducing the impact of movement on measurement stability.
3Productivity
If multiple antenna arrays are used to reduce beam measurement time, then the productivity is improved, but the device complexity increases
Solution Approach 1:
The patent segments the antenna system into multiple independent antenna arrays (first antenna array and second antenna array), where each array can perform beam measurements independently or in coordination. This segmentation allows parallel measurement operations, improving productivity by reducing total measurement time. The modular segmented structure also manages complexity by allowing each array to be optimized independently while working together for the overall beam determination function.
Data Source
AI summary
An electronic device is disclosed. The electronic device includes a first antenna array including a plurality of first antenna elements, a second antenna array including a plurality of second antenna elements, and a processor. The processor measures first signal strengths for every a plurality of beam indexes by means of the first antenna array and the second antenna array, determines second signal strengths for every the plurality of beam indexes by means of the first antenna array, and determines a beam index, a signal strength of which is maximal, based on a difference between the first signal strength and the second signal strength corresponding to a beam index selected among the plurality of beam indexes.