Antenna Array Beam Pattern Predefinition for Wireless Testing

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Solution Overview

Problem

Current wireless testing methods are not fast or precise enough, necessitating the enhancement of wireless testing and measurement techniques.

Innovation Solution

Predefining beam patterns for apparatuses under test and measuring these patterns to evaluate their behavior, allowing for automatic formation of beam patterns and reducing the time required for adjustments and alignments.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of time

If traditional wireless testing methods are used, then measurement completeness is maintained, but measurement time is excessively long

Engineering Contradiction:

Improvemeasurement timeVSAvoidmeasurement completeness

Core Design Contradiction:

Loss of timeVSMeasurement precision

Solution Approach 1:

The patent applies preliminary action by pre-defining beam patterns before actual measurement. The measurement environment pre-configures multiple beam patterns that the apparatus under test can selectively form, eliminating the need for real-time beam pattern design and optimization during measurement. This preparatory configuration significantly reduces measurement time while maintaining measurement completeness.

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

The patent implements dynamics by enabling the apparatus under test to dynamically switch between different pre-defined beam patterns. The system allows rapid transition between multiple beam patterns without requiring physical repositioning or mechanical adjustment, thereby reducing measurement time while maintaining comprehensive measurement coverage through the ability to measure multiple beam patterns sequentially.

Inventive Principle:

Principle #15Dynamics

2Measurement precision

If manual adjustment and alignment of apparatus is performed, then measurement accuracy is achieved, but time consumption increases significantly

Engineering Contradiction:

Improvebeam pattern measurement accuracyVSAvoidadjustment and alignment time

Core Design Contradiction:

Measurement precisionVSLoss of time

Solution Approach 1:

The patent replaces mechanical adjustment and alignment systems with electronic beam pattern control. Instead of physically adjusting antenna positions or orientations to achieve proper beam alignment, the system uses electronic configuration of beam patterns through signal processing and phase control. This substitution eliminates time-consuming mechanical adjustments while maintaining measurement accuracy through precise electronic beamforming control.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

3Productivity

If comprehensive beam pattern measurement is performed, then evaluation completeness is maintained, but measurement speed decreases

Engineering Contradiction:

Improvemeasurement speedVSAvoidevaluation completeness

Core Design Contradiction:

ProductivityVSReliability

Solution Approach 1:

The patent applies segmentation by dividing the comprehensive beam pattern measurement into multiple discrete, pre-defined beam patterns. Each beam pattern is independently configured and can be measured separately. This segmentation allows the system to efficiently switch between different beam patterns for measurement while ensuring that all necessary beam characteristics are evaluated through the collective measurement of multiple segmented patterns, thereby maintaining evaluation completeness while improving measurement speed.

Inventive Principle:

Principle #1Segmentation

Data Source

PatentEP3811089B1Method and measurement environment, apparatus to be tested

Publication Date: 2025.05.21 FRAUNHOFER GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG EV

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AI summary

A method for evaluating an apparatus having at least one antenna array, the apparatus configured for forming a plurality of communication beam patterns using the antenna array, comprises positioning of the apparatus in a measurement environment or moving/switching the probe/link antenna(s) of the measurement environment around the apparatus adapted to measure beam patterns and controlling the apparatus so as to form a predefined beam pattern of the plurality of communication beam patterns. The method comprises measuring the predefined beam pattern using the measurement environment and/or the apparatus.