Surface-Integrated Antenna Array Fixture for Isolated Element Testing
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Solution Overview
Problem
Conventional testing methods for Substrate Integrated Antenna Arrays (SIAs) with a large number of antenna elements at millimeter frequencies face challenges due to the need for connector-based testing, which is cumbersome, lossy, and inefficient, especially as the number of elements increases, and radiated testing is time-consuming and lacks isolation of individual antenna elements.
Innovation Solution
A test fixture assembly with electrically conductive via fences and cavities that isolate antenna elements, allowing for per-antenna element measurements without connectors, using sensors and a controller to perform measurements such as amplitude error, phase error, and adjacent channel leakage ratio.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If connector-based testing is used for each antenna element, then individual antenna element testing is enabled, but the testing becomes cumbersome, lossy, and complex especially for large number of elements
Solution Approach 1:
The substrate is divided into multiple isolated cavities, each containing a single antenna element. This segmentation allows individual testing of each antenna element without requiring external connectors, thereby reducing testing complexity while maintaining measurement precision for each element
Solution Approach 2:
Electrically conductive via fences are introduced as intermediary structures to electrically isolate adjacent antenna elements. These via fences act as mediators that enable individual element testing by preventing electromagnetic coupling between neighboring elements, eliminating the need for complex connector-based isolation
2Ease of operation
If radiated testing in an anechoic chamber is used, then connector-less testing is achieved, but test time increases significantly since each antenna element must be tested separately
Solution Approach 1:
Multiple antenna elements are integrated onto a single substrate with built-in electrical isolation via conductive via fences. This merging allows simultaneous or rapid sequential testing of multiple elements using conducted testing methods, dramatically reducing test time compared to radiated testing while maintaining connector-less operation
Solution Approach 2:
The patent replaces radiated testing (which requires physical anechoic chambers and sequential element testing) with conducted testing through integrated cavities. This substitution eliminates the time-consuming radiated testing process while achieving connector-less testing through the built-in cavity structure
3Measurement precision
If conducted testing with physical connectors is used, then individual transceiver chain testing is enabled, but the connectors introduce unnecessary loss and complexity especially at high frequencies
Solution Approach 1:
External physical connectors are completely removed from the testing system. Instead, the substrate itself is structured with integrated cavities and conductive via fences that provide electrical isolation and testing access directly at the antenna element level, eliminating connector-related losses and complexities
Solution Approach 2:
The substrate structure itself provides the testing functionality through its integrated cavity design. The substrate serves dual purposes: as the mounting platform for antenna elements and as the testing structure with built-in isolation, eliminating the need for external connectors and reducing energy loss
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient and isolated testing of individual antenna elements, reducing test time and complexity, and providing comprehensive performance metrics without the need for physical connectors, thus improving the testing efficiency and accuracy of SIA systems.
Implementation Method 1
The test fixture assembly and the via fence electrically isolate the antenna elements from one another
Data Source
Figure 1
Figure 2
Figure 3A~3B
AI summary
Systems and methods relating to performing individual transmit and/or receive measurements for each antenna element in an antenna array implemented on an Substrate Integrated Antenna Array (SIAA) are disclosed. In some embodiments, an SIAA comprises a substrate, one or more antenna elements at a surface of the substrate, and an electrically conductive via fence having a first side electrically coupled to ground within the substrate and a second side at the surface of the substrate, the electrically conductive via fence separately circumscribing each antenna element of the one or more antenna elements within the substrate. The SIAA enables the use of a respective test structure to perform per-antenna element measurements.