Antenna-Free BER Testing via Pulse Shaping and Direct Coupling
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Solution Overview
Problem
Current wireless receiver chip testing methods are inefficient for high-volume, high-throughput automated parametric testing, particularly for bit error rate (BER) testing, due to issues with antenna artifacts, noise pickup, and interference, leading to inaccurate results and time-consuming calibration processes.
Innovation Solution
A test system that includes a pulse shaping circuit and modulation circuit for antenna-free coupling to a device under test (DUT), using a pulse shaping filter circuit and amplitude modulator to emulate antenna effects, allowing for reliable BER testing without actual use antennas.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If actual use antennas are used for BER testing, then measurement accuracy is improved, but test complexity and calibration time increase significantly
Solution Approach 1:
The patent creates an electrical equivalent model that copies the essential characteristics of antenna behavior (impedance matching, signal coupling, and loading effects) without using physical antennas. The test system uses a signal generator connected directly to the receiver chip through a controlled impedance transmission line, replicating the electrical conditions of actual antenna operation. This allows BER testing to accurately reflect real-world performance while eliminating the complexity of physical antenna setup, positioning, and calibration.
2Measurement precision
If actual use antennas are used for BER testing, then signal amplitude accuracy is improved, but noise pickup and interference increase
Solution Approach 1:
The patent extracts and eliminates the physical antenna component from the test setup, retaining only the essential electrical characteristics needed for accurate BER measurement. By removing the antenna from the test configuration and using direct electrical coupling between the signal generator and receiver chip, the system eliminates the primary sources of noise and interference associated with antenna operation (electromagnetic radiation, susceptibility to external interference, and signal reflection). The electrical equivalent model preserves signal amplitude accuracy while operating in a controlled, shielded environment.
3Productivity
If antenna-free testing is used, then test speed and throughput are improved, but measurement accuracy deteriorates
Solution Approach 1:
The patent changes the fundamental parameters of the test signal and coupling method to enable accurate antenna-free testing. Instead of using radio frequency signals that require antennas for transmission, the system uses baseband or intermediate frequency signals that can be directly coupled to the receiver chip through controlled impedance lines. The signal generator is configured to output signals with appropriate amplitude, frequency, and modulation characteristics that match actual wireless reception conditions. This parameter transformation allows the receiver chip to be tested in its final packaged form without antennas, achieving both high throughput and accurate BER measurements that reflect real-world performance.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables high-volume, high-speed automated device parametric testing with reliable BER results, reducing test time and overcoming antenna-related inaccuracies, while supporting low signal amplitudes and high blocker signals, thus increasing the range of wireless communication systems like vehicle PKE systems.
Implementation Method 1
a pulse shaping filter circuit coupled between the pulse shaping circuit input terminal and the pulse shaping circuit output terminal
Implementation Method 2
The transformer includes a primary winding coupled to the modulator output terminal, and a secondary winding
Data Source
AI summary
A test system and interface circuitry for antenna-free bit error rate testing of an electronic device under test, including a pulse shaping circuit with a pulse shaping filter circuit to pulse shape a modulating signal before amplitude modulation with a carrier signal, and the amplitude modulated signal is coupled directly or via a transformer and a socket to the device under test without antennas to facilitate automated device testing with simple reconfiguration of signal generators for different device type. A method includes filtering a square wave modulating signal to create a pulse shaped modulating signal, amplitude modulating a carrier signal with the pulse shaped modulating signal to create an amplitude modulated signal, providing the amplitude modulated signal to the socket, and evaluating a bit error rate of the DUT according to receive data from the DUT and according to the BER test transmit data.


