Embedded Antenna Array Metrology Circuit for Faster Phased Array Testing
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Solution Overview
Problem
Conventional phased antenna array testing methods are costly, time-consuming, and prone to mechanical maneuvering errors, limiting throughput and accuracy.
Innovation Solution
An integrated antenna array testing circuit with a testing sequence generation logic and memory to efficiently determine and apply testing states to each antenna element, reducing data upload complexity and testing time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If mechanical maneuvering is used to position antennas during testing, then measurement coverage is improved, but measurement precision deteriorates due to mechanical errors
Solution Approach 1:
The patent replaces mechanical maneuvering systems with an electronic/phased array system. Instead of physically moving antennas or probes to achieve different measurement configurations, the system uses electronic beam forming and signal processing to synthesize different measurement perspectives and positions. This substitution eliminates mechanical errors in angle and distance measurement while maintaining full measurement coverage through computational methods.
Solution Approach 2:
The patent creates virtual copies of physical measurement positions through signal processing. By processing signals from fixed antenna elements with different phase and amplitude weights, the system synthesizes measurement data equivalent to having physical antennas at multiple positions and angles. This allows comprehensive measurement coverage without actual mechanical movement.
2Measurement precision
If comprehensive antenna testing is performed, then measurement accuracy is improved, but productivity deteriorates due to time-consuming processes
Solution Approach 1:
The patent enables continuous testing by eliminating mechanical repositioning time. Multiple measurement configurations are performed simultaneously or in rapid succession using electronic beam forming, allowing the testing process to continue without interruption. The system can cycle through different measurement scenarios continuously, significantly increasing throughput while maintaining comprehensive measurement capabilities.
Solution Approach 2:
The patent implements periodic scanning of beam directions and measurement configurations through electronic control rather than mechanical movement. The beam can be electronically steered through different angles and positions in a periodic sequence, achieving comprehensive coverage much faster than mechanical systems while maintaining measurement accuracy through precise electronic phase control.
3Loss of information
If traditional testing equipment and procedures are used, then measurement comprehensiveness is improved, but device complexity increases due to expensive equipment
Solution Approach 1:
The patent makes the phased antenna array itself multi-functional by integrating testing capabilities into its normal operation. The same antenna elements used for communication also serve as transmitters and receivers for self-testing. The beam forming network and signal processing infrastructure serve dual purposes: normal communication functions and comprehensive antenna performance measurement, eliminating the need for separate dedicated testing equipment.
Solution Approach 2:
The patent implements self-testing where the antenna array tests itself without external specialized equipment. The array transmits test signals through its own elements and receives the responses, performing autonomous characterization of its performance. This self-service approach eliminates complex external testing infrastructure while achieving complete measurement of antenna parameters.
Data Source
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AI summary
An antenna array testing circuit can include a circuitry including a plurality of memory registers, a testing sequence generation logic, and a testing control logic. The memory registers can store, for each antenna element of a plurality of antenna elements of the phased antenna array, a corresponding antenna element ID. The memory registers can store a testing step ID indicative of a testing step of a sequence of testing steps. The testing sequence generation logic can determine, for each antenna element of the phased antenna array, using the corresponding antenna element ID and the testing step ID, a corresponding testing signal indicative of a testing state of the antenna element during the testing step. The testing control logic can cause each antenna element the phased antenna array to be configured according to the corresponding testing signal during the testing step.