Antenna Measurement System Using Reflector Planar Wave Simulation
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Solution Overview
Problem
Current measurement systems for testing devices under test are complex and costly, requiring significant effort to obtain intended results, and often cannot perform all necessary measurements, necessitating the use of different systems.
Innovation Solution
A measurement system comprising at least two measurement antennas, reflectors, and a shielded space, where the antennas are oriented to direct signals into side lobe or back lobe areas, and reflectors generate planar waves at different angles to simulate multiple base stations or MIMO channels, allowing for simultaneous testing of device under test characteristics without direct signal alignment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple measurement antennas are located in the far-field to test far-field characteristics accurately, then measurement precision is improved, but device complexity and cost increase significantly
Solution Approach 1:
The patent introduces reflectors as intermediary elements that redirect electromagnetic waves from the measurement antennas to the device under test. This allows the measurement antennas to be positioned away from the direct far-field path while still achieving accurate far-field measurements through the reflected wave paths, thereby reducing system complexity while maintaining measurement precision.
Solution Approach 2:
The patent employs multiple reflectors positioned at different spatial locations and orientations to create multiple reflected wave paths. This dimensional approach allows the system to achieve far-field measurement capability without requiring all measurement antennas to be positioned in the traditional far-field configuration, simplifying the overall system architecture.
2Power
If measurement antennas are oriented with main lobe facing the device under test, then signal strength is improved, but measurement versatility is reduced as only direct far-field characteristics can be measured
Solution Approach 1:
The patent segments the measurement function by using multiple measurement antennas, each oriented with its main lobe facing a different reflector. This segmentation allows each antenna to maintain optimal signal strength toward its assigned reflector while the collective system achieves versatility in measuring different far-field characteristics through the different reflected paths.
Solution Approach 2:
The reflector array serves multiple functions: it redirects signals from measurement antennas to the device under test, enables measurement of different far-field radiation patterns, and allows the system to maintain signal strength while achieving measurement versatility. This multi-functionality resolves the contradiction between signal strength and measurement capability range.
3Adaptability or versatility
If different measurement systems are used for different measurement types, then measurement versatility is improved, but device complexity and operational complexity increase
Solution Approach 1:
The patent creates a universal measurement system where a single setup with multiple measurement antennas and reflectors can perform various far-field measurements including radiation patterns, antenna gain, and other characteristics. This multi-functional system eliminates the need to switch between different measurement systems, thereby improving ease of operation while maintaining comprehensive measurement versatility.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration simplifies and cost-efficiently enables the simulation of multiple base stations or MIMO channels, allowing for comprehensive testing of device under test characteristics, including MIMO transmission and receiving characteristics, while avoiding interference and enhancing measurement accuracy.
Implementation Method 1
wherein said reflectors are located such that each reflector generates and/or collimates a planar wave at different angles with respect to said testing position
Data Source
Figure 1
AI summary
A measurement system (10) for testing a device under test (20) is described that comprises at least one signal unit (22) for processing a signal, at least two measurement antennas (14), at least two reflectors (16), a shielded space (12), and a testing position (18) for said device under test (20). Each measurement antenna (14) is orientated with respect to said testing position (18) such that said testing position (18) is located in at least one of a side lobe area and a back lobe area (30) of said measurement antennas (14). Said reflectors (16) are located such that each reflector (16) generates and/or collimates a planar wave at different angles with respect to said testing position (18). Further, a method for performing test measurements is described.