Antenna Tuning Element Test System with Pressure Sensor
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Solution Overview
Problem
Conventional antenna structures in small electronic devices often have limited bandwidth, making it difficult to cover all desired communications bands, and there is a need for a method to test antenna tuning elements without damaging them.
Innovation Solution
Incorporating antenna tuning elements with radio-frequency switches and tunable resistive/inductive/capacitive components, and a test system that includes a device retention structure with a pressure sensor and positioning device to calibrate and securely mate the antenna tuning elements during testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Volume of moving object
If conventional antenna structures are used in small electronic devices, then the device form factor is reduced, but the antenna bandwidth becomes narrow and cannot cover all communications bands
Solution Approach 1:
The patent applies dynamics by making the antenna impedance characteristics adjustable through tuning elements. The antenna structure includes variable components that can be dynamically reconfigured to change resonant frequencies and impedance matching, allowing a compact antenna to adaptively cover multiple frequency bands despite its small volume.
Solution Approach 2:
The patent implements parameter changes by modifying the electrical characteristics of the antenna through tuning elements. By changing parameters such as capacitance, inductance, and resistance values in real-time, the antenna can shift its operating frequencies and maintain wide bandwidth coverage within a constrained physical volume.
2Ease of manufacture
If antenna tuning elements are tested without proper retention structure, then testing is simpler, but the tuning elements may shift or become damaged during testing
Solution Approach 1:
The patent introduces a retention structure as an intermediary component between the tuning element and the test environment. This structure provides mechanical support and positioning, ensuring the tuning element remains stable and undamaged during testing while still allowing electrical connections for measurement.
Solution Approach 2:
The patent segments the testing system into distinct functional components: the tuning element under test, the retention structure for mechanical support, and the test equipment for measurement. This segmentation allows each component to be optimized independently while maintaining overall system reliability.
3Force
If excessive force is applied by the retention structure during testing, then the DUT is securely held, but the tuning element may be damaged
Solution Approach 1:
The patent implements feedback by using a pressure sensor to monitor the force applied by the retention structure on the tuning element during testing. The system continuously measures the contact force and adjusts the retention mechanism to maintain optimal pressure, preventing both insufficient holding and excessive force that could damage the delicate tuning elements.
Data Source
AI summary
A test system for testing a device under test (DUT) is provided. The test system may include a DUT receiving structure configured to receive the DUT during testing and a DUT retention structure that is configured to press the DUT against the DUT receiving structure so that DUT cannot inadvertently shift around during testing. The DUT retention structure may include a pressure sensor operable to detect an amount of pressure that is applied to the DUT. The DUT retention structure may be raised and lowered vertically using a manually-controlled or a computer-controlled positioner. The positioner may be adjusted using a coarse tuning knob and a fine tuning knob. The positioner may be calibrated such that the DUT retention structure applies a sufficient amount of pressure on the DUT during production testing.