Anti-Static Shield for Semiconductor Wafer Handling

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Solution Overview

Problem

As semiconductor manufacturing advances, the increasing sensitivity of feature sizes on wafers makes them vulnerable to dust particles, which can cause defects in integrated circuits and reduce production yield despite efforts to maintain a clean environment.

Innovation Solution

A shield attached to robot arms in semiconductor production tools, made of anti-static materials with rounded edges and adjustable positioning, is used to protect wafers from dust particles by providing a larger surface area coverage and reducing electrostatic charge, and optionally equipped with injectors to blow away dust and an air ionizer to neutralize static charges.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If feature size is reduced to increase integration density, then productivity is improved, but sensitivity to dust particles increases leading to more defects

Engineering Contradiction:
Improveintegration densityVSAvoiddust particle sensitivity
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

A shield is introduced as an intermediary component between the wafer and the surrounding environment. The shield physically blocks dust particles from reaching the wafer surface during handling and processing, thereby resolving the contradiction by protecting the wafer while allowing continued reduction in feature size for higher integration density.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If a shield is added to protect wafers from dust, then reliability is improved, but device complexity increases

Engineering Contradiction:
Improvedefect reductionVSAvoidtool structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The shield is implemented as a thin, flexible barrier that can be easily integrated into the existing tool structure. This approach provides effective dust protection while minimizing the increase in device complexity, as the thin film nature of the shield allows it to be incorporated without significantly altering the overall tool design or adding substantial structural complexity.

Inventive Principle:
Principle #30Flexible shells and thin films

3Object-affected harmful factors

If anti-static materials are used for the shield, then dust particle attraction is reduced, but manufacturing precision requirements increase

Engineering Contradiction:
Improveelectrostatic dust attractionVSAvoidshield fabrication
Core Design Contradiction:
Object-affected harmful factorsVSManufacturing precision

Solution Approach 1:

The shield material properties are optimized by changing parameters such as surface resistivity and thickness to achieve effective electrostatic protection. By carefully selecting and tuning these material parameters, the shield provides sufficient anti-static protection while maintaining manufacturability within standard fabrication capabilities, thus resolving the contradiction between reduced dust attraction and manufacturing precision requirements.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The shield significantly reduces the number of dust particles on wafers, leading to a substantial decrease in device defects and improved production yield, with an over 80% reduction in dust particles observed compared to conventional tools.

Implementation Method 1

A shield attached to robot arms in semiconductor production tools, made of anti-static materials with rounded edges

Methodology Applied
Scientific EffectElectrostatics: Electrostatics

Implementation Method 2

an air ionizer to neutralize static charges

Methodology Applied
Scientific EffectIonization: Ionisation

Data Source

PatentUS10755961B2Semiconductor tool with a shield
Publication Date: 2020.08.25 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US10755961B2 patent drawing
  • US10755961B2 patent drawing
  • US10755961B2 patent drawing

AI summary

A method includes loading a wafer onto a robot arm, wherein a shield is disposed over the wafer, moving the wafer from a first location to a second location, and unloading the wafer from the robot arm.